參數(shù)資料
型號: LPC2921FBD100
廠商: NXP SEMICONDUCTORS
元件分類: 微控制器/微處理器
英文描述: ARM9 microcontroller with CAN, LIN, and USB
中文描述: 32-BIT, FLASH, 125 MHz, RISC MICROCONTROLLER, PQFP100
封裝: 14 X 14 MM, 1.40 MM HEIGHT, PLASTIC, MS-026, SOT407-1, LQFP-100
文件頁數(shù): 68/84頁
文件大?。?/td> 551K
代理商: LPC2921FBD100
LPC2921_23_25_3
All information provided in this document is subject to legal disclaimers.
NXP B.V. 2010. All rights reserved.
Product data sheet
Rev. 03 — 14 April 2010
68 of 84
NXP Semiconductors
LPC2921/2923/2925
ARM9 microcontroller with CAN, LIN, and USB
9.4 Dynamic characteristics: SPI
[1]
All parameters are guaranteed over the virtual junction temperature range by design. Pre-testing is performed at T
amb
= 85
°
C ambient
temperature on wafer level. Cased products are tested at T
amb
= 25
°
C (final testing). Both pre-testing and final testing use correlated
test conditions to cover the specified temperature and power supply voltage range.
Table 36.
V
DD(CORE)
= V
DD(OSC_PLL)
; V
DD(IO)
= 2.7 V to 3.6 V; V
DDA(ADC3V3)
= 3.0 V to 3.6 V; T
vj
=
40
°
C to +85
°
C; all voltages are
measured with respect to ground; positive currents flow into the IC; unless otherwise specified.
[1]
Symbol
Parameter
Conditions
f
SPI
SPI operating frequency
master operation
slave operation
t
su(SPI_MISO)
SPI_MISO set-up time
T
amb
= 25
°
C;
measured in
SPI Master
mode; see
Figure 24
Dynamic characteristics of SPI pins
Min
Typ
-
-
11
Max
Unit
1
65024
f
clk(SPI)
1
65024
f
clk(SPI)
-
1
2
f
clk(SPI)
MHz
1
4
f
clk(SPI)
MHz
-
ns
Fig 24. SPI data input set-up time in SSP Master mode
t
su(SPI_MISO)
SCKn
shifting edges
SDOn
SDIn
002aae695
sampling edges
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