參數(shù)資料
型號(hào): LH28F040SUTD-Z4
廠商: Sharp Corporation
英文描述: 4M (512K 】 8) Flash Memory
中文描述: 4分(為512k】8)閃存
文件頁(yè)數(shù): 19/32頁(yè)
文件大?。?/td> 247K
代理商: LH28F040SUTD-Z4
4M (512K × 8) Flash Memory
LH28F040SUTD-Z4
19
*
WARNING: Stressing the device beyond the “Abso-
lute Maximum Ratings” may cause permanent dam-
age. These are stress ratings only. Operation beyond
the “Operating Conditions” is not recommended and
extended exposure beyond the Operating Conditions”
may affect device reliability.
ELECTRICAL SPECIFICATIONS
Absolute Maximum Ratings*
Temperature under bias ......................-20°C to +80°C
Storage temperature .........................-65°C to +125°C
SYMBOL
PARAMETER
MIN.
MAX.
UNITS
TEST CONDITIONS
NOTE
T
A
Operating Temperature, Commercial
0
70.0
°C
Ambient Temperature
1
V
CC
V
CC
with Respect to GND
-0.2
7.0
V
2
V
PP
V
PP
Supply Voltage with Respect to GND
-0.2
7.0
V
2
V
Voltage on any Pin (Except V
CC
, V
PP
)
with Respect to GND
-0.5
V
CC
+ 0.5
V
2
I
Current into any Non-Supply Pin
±30
mA
I
OUT
Output Short Circuit Current
100.0
mA
3
NOTES:
1. Operating temperature is for commercial product defined by this specification.
2. Minimum DC voltage is -0.5 V on input/output pins. During transitions, this level may undershoot to -2.0 V for periods < 20 ns. Maximum
DC voltage on input/output pins is V
CC
+ 0.5 V which, during transitions, may overshoot to V
CC
+ 2.0 V for periods < 20 ns.
3. Output shorted for no more than one second. No more than one output shorted at a time.
Capacitance
NOTE:
1. Sampled, not 100% tested.
2. BE
0
and BE
1
have half the value of this.
SYMBOL
PARAMETER
TYP.
MAX.
UNITS
TEST CONDITIONS
NOTE
C
IN
Capacitance Looking into an
Address/Control Pin
14
20
pF
T
A
= 25°C, f = 1.0 MHz
1, 2
C
OUT
Capacitance Looking into an Output Pin
18
24
pF
T
A
= 25°C, f = 1.0 MHz
1
C
LOAD
Load Capacitance Driven by Outputs for
Timing Specifications
50
pF
For V
CC
= 3.3 V ±0.3 V
1
Equivalent Testing Load Circuit V
CC
± 10%
2.5
ns
50
transmission line delay
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