參數資料
型號: LC4032ZC-75T48I
廠商: LATTICE SEMICONDUCTOR CORP
元件分類: PLD
英文描述: 3.3V/2.5V/1.8V In-System Programmable SuperFAST High density PDLs
中文描述: EE PLD, 7.5 ns, PQFP48
封裝: 1 MM HEIGHT, TQFP-48
文件頁數: 13/91頁
文件大?。?/td> 851K
代理商: LC4032ZC-75T48I
Lattice Semiconductor
ispMACH 4000V/B/C/Z Family Data Sheet
13
Figure 10. Global OE Generation for ispMACH 4032
Zero Power/Low Power and Power Management
The ispMACH 4000 family is designed with high speed low power design techniques to offer both high speed and
low power. With an advanced E
low power cell and non sense-ampli
fi
er design approach (full CMOS logic
approach), the ispMACH 4000 family offers SuperFAST pin-to-pin speeds, while simultaneously delivering low
standby power without needing any “turbo bits” or other power management schemes associated with a traditional
sense-ampli
fi
er approach.
2
The zero power ispMACH 4000Z is based on the 1.8V ispMACH 4000C family. With innovative circuit design
changes, the ispMACH 4000Z family is able to achieve the industry’s “l(fā)owest static power”.
IEEE 1149.1-Compliant Boundary Scan Testability
All ispMACH 4000 devices have boundary scan cells and are compliant to the IEEE 1149.1 standard. This allows
functional testing of the circuit board on which the device is mounted through a serial scan path that can access all
critical logic notes. Internal registers are linked internally, allowing test data to be shifted in and loaded directly onto
test nodes, or test node data to be captured and shifted out for veri
fi
cation. In addition, these devices can be linked
into a board-level serial scan path for more board-level testing. The test access port operates with an LVCMOS
interface that corresponds to the power supply voltage.
I/O Quick Con
fi
guration
To facilitate the most ef
fi
cient board test, the physical nature of the I/O cells must be set before running any continu-
ity tests. As these tests are fast, by nature, the overhead and time that is required for con
fi
guration of the I/Os’
physical nature should be minimal so that board test time is minimized. The ispMACH 4000 family of devices allows
this by offering the user the ability to quickly con
fi
gure the physical nature of the I/O cells. This quick con
fi
guration
takes milliseconds to complete, whereas it takes seconds for the entire device to be programmed. Lattice's
ispVM System programming software can either perform the quick con
fi
guration through the PC parallel port, or
can generate the ATE or test vectors necessary for a third-party test system.
Shared PTOE
(Block 0)
Shared PTOE
(Block 1)
Global
Fuses
GOE (3:0)
to I/O cells
Internal Global OE
PT Bus
(2 lines)
4-Bit
Global OE Bus
Global OE
Fuse connection
Hard wired
相關PDF資料
PDF描述
LC4032ZC-35T48C 3.3V/2.5V/1.8V In-System Programmable SuperFAST High density PDLs
LC4032ZC-5M56C 3.3V/2.5V/1.8V In-System Programmable SuperFAST High density PDLs
LC4032ZC-5M56I 3.3V/2.5V/1.8V In-System Programmable SuperFAST High density PDLs
LC4032ZC-5T48C 3.3V/2.5V/1.8V In-System Programmable SuperFAST High density PDLs
LC4032ZC-5T48I 3.3V/2.5V/1.8V In-System Programmable SuperFAST High density PDLs
相關代理商/技術參數
參數描述
LC4032ZC-75TN48C 功能描述:CPLD - 復雜可編程邏輯器件 PROGRAMMABLE SUPER FAST HI DENSITY PLD RoHS:否 制造商:Lattice 系列: 存儲類型:EEPROM 大電池數量:128 最大工作頻率:333 MHz 延遲時間:2.7 ns 可編程輸入/輸出端數量:64 工作電源電壓:3.3 V 最大工作溫度:+ 90 C 最小工作溫度:0 C 封裝 / 箱體:TQFP-100
LC4032ZC-75TN48E 功能描述:CPLD - 復雜可編程邏輯器件 PROGRAMMABLE SUPER FAST HI DENSITY PLD RoHS:否 制造商:Lattice 系列: 存儲類型:EEPROM 大電池數量:128 最大工作頻率:333 MHz 延遲時間:2.7 ns 可編程輸入/輸出端數量:64 工作電源電壓:3.3 V 最大工作溫度:+ 90 C 最小工作溫度:0 C 封裝 / 箱體:TQFP-100
LC4032ZC-75TN48I 功能描述:CPLD - 復雜可編程邏輯器件 PROGRAMMABLE SUPER FAST HI DENSITY PLD RoHS:否 制造商:Lattice 系列: 存儲類型:EEPROM 大電池數量:128 最大工作頻率:333 MHz 延遲時間:2.7 ns 可編程輸入/輸出端數量:64 工作電源電壓:3.3 V 最大工作溫度:+ 90 C 最小工作溫度:0 C 封裝 / 箱體:TQFP-100
LC4032ZC-EV 功能描述:可編程邏輯 IC 開發(fā)工具 Eval Board for MACH4032ZC RoHS:否 制造商:Altera Corporation 產品:Development Kits 類型:FPGA 工具用于評估:5CEFA7F3 接口類型: 工作電源電壓:
LC4032ZE4MN100C 制造商:LATTICE 制造商全稱:Lattice Semiconductor 功能描述:1.8V In-System Programmable Ultra Low Power PLDs