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參數(shù)資料
| 型號(hào)： | LA4128ZC-75TN100E |
| 廠商： | Lattice Semiconductor Corporation |
| 文件頁(yè)數(shù)： | 5/42頁(yè) |
| 文件大小： | 0K |
| 描述： | IC CPLD 128MACROCELLS 100TQFP |
| 標(biāo)準(zhǔn)包裝： | 90 |
| 系列： | LA-ispMACH |
| 可編程類(lèi)型： | 系統(tǒng)內(nèi)可編程 |
| 最大延遲時(shí)間 tpd(1)： | 7.5ns |
| 電壓電源 - 內(nèi)部： | 1.7 V ~ 1.9 V |
| 宏單元數(shù)： | 128 |
| 輸入/輸出數(shù)： | 64 |
| 工作溫度： | -40°C ~ 125°C |
| 安裝類(lèi)型： | 表面貼裝 |
| 封裝/外殼： | 100-LQFP |
| 供應(yīng)商設(shè)備封裝： | 100-TQFP（14x14） |
| 包裝： | 托盤(pán) |
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Lattice Semiconductor
LA-ispMACH 4000V/Z Automotive Family Data Sheet
13
and inputs without being damaged. Additionally, it requires that the effects of I/O pin loading be minimal on active
signals. The LA-ispMACH 4000V/Z automotive devices provide this capability for input voltages in the range 0V to
3.0V.
Density Migration
The LA-ispMACH 4000V/Z automotive family has been designed to ensure that different density devices in the
same package have the same pin-out. Furthermore, the architecture ensures a high success rate when performing
design migration from lower density parts to higher density parts. In many cases, it is possible to shift a lower utili-
zation design targeted for a high density device to a lower density device. However, the exact details of the nal
resource utilization will impact the likely success in each case.
AEC-Q100 Tested and Qualied
The Automotive Electronics Council (AEC) consists of two committees: the Quality Systems Committee and the
Component Technical Committee. These committees are composed of representatives from sustaining and other
associate members. The AEC Component Technical Committee is the standardization body for establishing stan-
dards for reliable, high quality electronic components. In particular, the AEC-Q100 specication “Stress Test for
Qualication for Integrated Circuits” denes qualication and re-qualication requirements for electronic compo-
nents. Components meeting these specications are suitable for use in the harsh automotive environment without
additional component-level qualication testing. Lattice's LA-ispMACH 4000V/Z and LA-MachXO devices com-
pleted and passed the requirements of the AEC-Q100 specication.
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| LA4128ZC-75TN128E | 制造商:LATTICE 制造商全稱(chēng):Lattice Semiconductor 功能描述:3.3V/1.8V In-System Programmable SuperFAST High Density PLDs |
| LA4128ZC-75TN144E | 制造商:LATTICE 制造商全稱(chēng):Lattice Semiconductor 功能描述:3.3V/1.8V In-System Programmable SuperFAST High Density PLDs |
| LA4128ZC-75TN44E | 制造商:LATTICE 制造商全稱(chēng):Lattice Semiconductor 功能描述:3.3V/1.8V In-System Programmable SuperFAST High Density PLDs |
| LA4128ZC-75TN48E | 制造商:LATTICE 制造商全稱(chēng):Lattice Semiconductor 功能描述:3.3V/1.8V In-System Programmable SuperFAST High Density PLDs |
| LA4128ZV-75TN100E | 制造商:LATTICE 制造商全稱(chēng):Lattice Semiconductor 功能描述:3.3V/1.8V In-System Programmable SuperFAST High Density PLDs |
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