參數(shù)資料
型號: KM23C4200D
廠商: SAMSUNG SEMICONDUCTOR CO. LTD.
英文描述: 4M-Bit (256Kx16) CMOS Mask ROM (EPROM Type)(4M位 (256Kx16) CMOS掩膜ROM)
中文描述: 4分位(256Kx16)的CMOS掩模ROM(EPROM的形式)(4分位(256Kx16)的CMOS掩膜光盤)
文件頁數(shù): 3/4頁
文件大小: 59K
代理商: KM23C4200D
KM23C4200D
CMOS MASK ROM
TEST CONDITIONS
Item
Value
Input Pulse Levels
0.6V to 2.4V
Input Rise and Fall Times
10ns
Input and Output timing Levels
0.8V and 2.0V
Output Loads
1 TTL Gate and C
L
=100pF
AC CHARACTERISTICS
(T
A
=0
°
C to +70
°
C, V
CC
=5V
±
10%, unless otherwise noted.)
READ CYCLE
Item
Symbol
KM23C4200D-8
KM23C4200D-10
KM23C4200D-12
Unit
Min
Max
Min
Max
Min
Max
Read Cycle Time
t
RC
80
100
120
ns
Chip Enable Access Time
t
ACE
80
100
120
ns
Address Access Time
t
AA
80
100
120
ns
Output Enable Access Time
t
OE
40
50
60
ns
Output or Chip Disable to
Output High-Z
t
DF
20
20
20
ns
Output Hold from Address Change
t
OH
0
0
0
ns
TIMING DIAGRAM
READ
ADD1
ADD2
VALID DATA
VALID DATA
t
OH
t
DF(Note)
ADD
CE
OE
D
OUT
t
RC
t
ACE
t
OE
t
AA
NOTE :
t
DF
is defined as the time at which the outputs achieve the open circuit condition and is not referenced to V
OH
or V
OL
level.
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