參數(shù)資料
型號: K4F151612D
廠商: SAMSUNG SEMICONDUCTOR CO. LTD.
英文描述: 1M x 16Bit CMOS Dynamic RAM with Fast Page Mode
中文描述: 100萬× 16的CMOS動態(tài)隨機(jī)存儲器的快速頁面模式
文件頁數(shù): 8/34頁
文件大?。?/td> 528K
代理商: K4F151612D
K4F171611D, K4F151611D
K4F171612D, K4F151612D
CMOS DRAM
t
CWD
is referenced to the later CAS falling edge at word read-modify-write cycle.
t
CWL
is specified from W falling edge to the earlier CAS rising edge
.
t
CSR
is referenced to the earlier CAS falling edge before RAS transition low.
t
CHR
is referenced to the later CAS rising edge after RAS transition low.
t
CSR
t
CHR
RAS
LCAS
UCAS
16.
15.
14.
13.
t
DS,
t
DH
is independently specified for lower byte DQ(0-7), upper byte DQ(8-15)
If
t
RASS
100us, then RAS precharge time must use
t
RPS
instead of
t
RP
.
For RAS-only refresh and burst CAS-before-RAS refresh mode, 4096(4K)/1024(1K) cycles of burst refresh must be executed
within 64ms/16ms before and after self refresh, in order to meet refresh specification.
For distributed CAS-before-RAS with 15.6us interval CAS-before-RAS refresh should be executed with in 15.6us immediately
before and after self refresh in order to meet refresh specification.
17.
18.
19.
20.
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參數(shù)描述
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