8 FN8273.1 September 5, 2013 tACQ<" />
鍙冩暩(sh霉)璩囨枡
鍨嬭櫉(h脿o)锛� ISL26323FBZ
寤犲晢锛� Intersil
鏂囦欢闋�(y猫)鏁�(sh霉)锛� 22/23闋�(y猫)
鏂囦欢澶�?銆�?/td> 0K
鎻忚堪锛� IC ADC 12BIT SPI/SRL 250K 8SOIC
妯�(bi膩o)婧�(zh菙n)鍖呰锛� 980
浣嶆暩(sh霉)锛� 12
閲囨ǎ鐜囷紙姣忕锛夛細 250k
鏁�(sh霉)鎿�(j霉)鎺ュ彛锛� 涓茶锛孲PI?
杞�(zhu菐n)鎻涘櫒鏁�(sh霉)鐩細 1
鍔熺巼鑰楁暎锛堟渶澶э級锛� 80mW
闆诲闆绘簮锛� 鍠浕婧�
宸ヤ綔婧害锛� -40°C ~ 125°C
瀹夎椤炲瀷锛� 琛ㄩ潰璨艰
灏佽/澶栨锛� 8-SOIC锛�0.154"锛�3.90mm 瀵級
渚涙噳(y墨ng)鍟嗚ō(sh猫)鍌欏皝瑁濓細 8-SOIC
鍖呰锛� 绠′欢
杓稿叆鏁�(sh霉)鐩拰椤炲瀷锛� 2 鍊�(g猫)鍠锛屽柈妤�
ISL26320, ISL26321, ISL26322, ISL26323, ISL26324, ISL26325, ISL26329
8
FN8273.1
September 5, 2013
tACQ
Acquisition Time in Auto Sleep Mode
1.7
s
tACQ
Acquisition time in Auto Power Down
Mode
150
s
tSCLKH
SCLK High Time
20
ns
tSCLKL
SCLK Low Time
20
ns
tCNV
CNV Pulse Width
100
ns
NOTES:
6. Compliance to datasheet limits is assured by one or more methods: production test, characterization and/or design.
7. The device may become nonresponsive if the minimum acquisition times are not met in their respective modes, requiring a power cycle to restore
normal operation.
8. Transition time to high impedance state is dominated by RC loading on the SDOUT pin. Specified value is measured using equivalent loading shown
in Figure 2.
Electrical Specifications VREF = VDD V, VDD = 2.7V to 5V, VCM = VDD/2, SCLK = 20MHz and TA = -40掳C to +125掳C (typical performance
at +25掳C), unless otherwise specified. Boldface limits apply over the operating temperature range, -40掳C to +125掳C. (Continued)
SYMBOL
PARAMETER
TEST LEVEL OR NOTES
MIN
(Note 6)
TYP
MAX
(Note 6)
UNITS
FIGURE 2. EQUIVALENT LOAD CIRCUIT FOR DIGITAL OUTPUT TESTING
OUTPUT PIN
CL
10pF
VDD
2k
RL
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鐩搁棞(gu膩n)浠ｇ悊鍟�/鎶€琛�(sh霉)鍙冩暩(sh霉)
鍙冩暩(sh霉)鎻忚堪
ISL26323FBZ-T 鍔熻兘鎻忚堪:IC ADC 12BIT SPI/SRL 250K 8SOIC RoHS:鏄� 椤炲垾:闆嗘垚闆昏矾 (IC) >> 鏁�(sh霉)鎿�(j霉)閲囬泦 - 妯℃暩(sh霉)杞�(zhu菐n)鎻涘櫒 绯诲垪:- 鐢�(ch菐n)鍝佸煿瑷�(x霉n)妯″:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 妯�(bi膩o)婧�(zh菙n)鍖呰:250 绯诲垪:- 浣嶆暩(sh霉):12 閲囨ǎ鐜囷紙姣忕锛�:1.8M 鏁�(sh霉)鎿�(j霉)鎺ュ彛:骞惰伅(li谩n) 杞�(zhu菐n)鎻涘櫒鏁�(sh霉)鐩�:1 鍔熺巼鑰楁暎锛堟渶澶э級:1.82W 闆诲闆绘簮:妯℃摤鍜屾暩(sh霉)瀛� 宸ヤ綔婧害:-40°C ~ 85°C 瀹夎椤炲瀷:琛ㄩ潰璨艰 灏佽/澶栨:48-LQFP 渚涙噳(y墨ng)鍟嗚ō(sh猫)鍌欏皝瑁�:48-LQFP锛�7x7锛� 鍖呰:绠′欢 杓稿叆鏁�(sh霉)鐩拰椤炲瀷:2 鍊�(g猫)鍠锛屽柈妤�
ISL26323FBZ-T7A 鍔熻兘鎻忚堪:IC ADC 12BIT SPI/SRL 250K 8SOIC RoHS:鏄� 椤炲垾:闆嗘垚闆昏矾 (IC) >> 鏁�(sh霉)鎿�(j霉)閲囬泦 - 妯℃暩(sh霉)杞�(zhu菐n)鎻涘櫒 绯诲垪:- 鐢�(ch菐n)鍝佸煿瑷�(x霉n)妯″:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 妯�(bi膩o)婧�(zh菙n)鍖呰:250 绯诲垪:- 浣嶆暩(sh霉):12 閲囨ǎ鐜囷紙姣忕锛�:1.8M 鏁�(sh霉)鎿�(j霉)鎺ュ彛:骞惰伅(li谩n) 杞�(zhu菐n)鎻涘櫒鏁�(sh霉)鐩�:1 鍔熺巼鑰楁暎锛堟渶澶э級:1.82W 闆诲闆绘簮:妯℃摤鍜屾暩(sh霉)瀛� 宸ヤ綔婧害:-40°C ~ 85°C 瀹夎椤炲瀷:琛ㄩ潰璨艰 灏佽/澶栨:48-LQFP 渚涙噳(y墨ng)鍟嗚ō(sh猫)鍌欏皝瑁�:48-LQFP锛�7x7锛� 鍖呰:绠′欢 杓稿叆鏁�(sh霉)鐩拰椤炲瀷:2 鍊�(g猫)鍠锛屽柈妤�
ISL26324 鍒堕€犲晢:INTERSIL 鍒堕€犲晢鍏ㄧū:Intersil Corporation 鍔熻兘鎻忚堪:12-bit, 250kSPS Low-power ADCs with Single-ended and Differential Inputs and Multiple Input Channels
ISL26324FVZ 鍔熻兘鎻忚堪:IC ADC 12BIT SPI/SRL 16-TSSOP RoHS:鏄� 椤炲垾:闆嗘垚闆昏矾 (IC) >> 鏁�(sh霉)鎿�(j霉)閲囬泦 - 妯℃暩(sh霉)杞�(zhu菐n)鎻涘櫒 绯诲垪:- 鐢�(ch菐n)鍝佸煿瑷�(x霉n)妯″:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 妯�(bi膩o)婧�(zh菙n)鍖呰:250 绯诲垪:- 浣嶆暩(sh霉):12 閲囨ǎ鐜囷紙姣忕锛�:1.8M 鏁�(sh霉)鎿�(j霉)鎺ュ彛:骞惰伅(li谩n) 杞�(zhu菐n)鎻涘櫒鏁�(sh霉)鐩�:1 鍔熺巼鑰楁暎锛堟渶澶э級:1.82W 闆诲闆绘簮:妯℃摤鍜屾暩(sh霉)瀛� 宸ヤ綔婧害:-40°C ~ 85°C 瀹夎椤炲瀷:琛ㄩ潰璨艰 灏佽/澶栨:48-LQFP 渚涙噳(y墨ng)鍟嗚ō(sh猫)鍌欏皝瑁�:48-LQFP锛�7x7锛� 鍖呰:绠′欢 杓稿叆鏁�(sh霉)鐩拰椤炲瀷:2 鍊�(g猫)鍠锛屽柈妤�
ISL26324FVZ-T 鍔熻兘鎻忚堪:IC ADC 12BIT SPI/SRL 16-TSSOP RoHS:鏄� 椤炲垾:闆嗘垚闆昏矾 (IC) >> 鏁�(sh霉)鎿�(j霉)閲囬泦 - 妯℃暩(sh霉)杞�(zhu菐n)鎻涘櫒 绯诲垪:- 鐢�(ch菐n)鍝佸煿瑷�(x霉n)妯″:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 妯�(bi膩o)婧�(zh菙n)鍖呰:250 绯诲垪:- 浣嶆暩(sh霉):12 閲囨ǎ鐜囷紙姣忕锛�:1.8M 鏁�(sh霉)鎿�(j霉)鎺ュ彛:骞惰伅(li谩n) 杞�(zhu菐n)鎻涘櫒鏁�(sh霉)鐩�:1 鍔熺巼鑰楁暎锛堟渶澶э級:1.82W 闆诲闆绘簮:妯℃摤鍜屾暩(sh霉)瀛� 宸ヤ綔婧害:-40°C ~ 85°C 瀹夎椤炲瀷:琛ㄩ潰璨艰 灏佽/澶栨:48-LQFP 渚涙噳(y墨ng)鍟嗚ō(sh猫)鍌欏皝瑁�:48-LQFP锛�7x7锛� 鍖呰:绠′欢 杓稿叆鏁�(sh霉)鐩拰椤炲瀷:2 鍊�(g猫)鍠锛屽柈妤�
鐧�(f膩)甯冪穵鎬ラ噰璩�(g貌u)锛�3鍒嗛悩宸﹀彸鎮ㄥ皣寰楀埌鍥炲京(f霉)銆�

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*鍨嬭櫉(h脿o) *鏁�(sh霉)閲� 寤犲晢 鎵硅櫉(h脿o) 灏佽
娣诲姞鏇村閲囪臣(g貌u)

鎴戠殑鑱�(li谩n)绯绘柟寮�

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