參數(shù)資料
型號(hào): IRHF7430SE
廠商: International Rectifier
英文描述: N-Channel Single Event Effect (SEE) Rad Hard HEXFET Transistor(N 溝道 單事件效應(yīng) Rad Hard HEXFET技術(shù)晶體管)
中文描述: N通道單粒子效應(yīng)(見)拉德硬的HEXFET晶體管(不適用溝道單事件效應(yīng)拉德硬盤的HEXFET技術(shù)晶體管)
文件頁數(shù): 7/8頁
文件大?。?/td> 91K
代理商: IRHF7430SE
IRHF7430SE Devices
www.irf.com
7
Q
G
Q
GS
Q
GD
V
G
Charge
D.U.T.
V
DS
I
D
I
G
3mA
V
GS
.3
μ
F
50K
.2
μ
F
12V
Current Regulator
Same Type as D.U.T.
Current Sampling Resistors
+
-
12 V
Fig 13b.
Gate Charge Test Circuit
Fig 13a.
Basic Gate Charge Waveform
Fig 12c.
Maximum Avalanche Energy
Vs. Drain Current
Fig 12b.
Unclamped Inductive Waveforms
Fig 12a.
Unclamped Inductive Test Circuit
tp
V
(BR)DSS
I
AS
R
G
I
AS
0.01
t
p
D.U.T
L
VDS
-V
D D
DRIVER
A
15V
20V
12V
Pre-Irradiation
25
50
75
100
125
150
0
50
100
150
200
250
300
350
Starting T , Junction Temperature ( C)
E
A
ID
1.2A
1.6A
2.6A
TOP
BOTTOM
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