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參數(shù)資料
| 型號： | IR2214SS |
| 廠商： | International Rectifier |
| 英文描述： | HALF-BRIDGE GATE DRIVER IC |
| 中文描述： | 半橋柵極驅(qū)動IC |
| 文件頁數(shù)： | 20/28頁 |
| 文件大小： | 308K |
| 代理商： | IR2214SS |
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20
IR2214/IR22141(SS)
www.irf.com
ADVANCE DATA
A
B
C
D
E
F
HIN
LIN
SY_FLT
FAULT/SD
FLT_CLR
HO (HOP/HON)
LO (LOP/LON)
Figure 18:
I/O logic diagram with SY_FLT and FAULT/SD as input
Referred to timing diagram of figure 17:
A. When the input signals are on together the
outputs go off (anti-shoot through).
B. The HO signal is on and the high side IGBT
desaturates, the HO turn off softly while the
SY_FLT stays low. When SY_FLT goes high
the FAULT/SD goes low. While in SSD, if
LIN goes up, LO does not change (freeze).
C. When FAULT/SD is latched low (see FAULT/
SD section) FLT_CLR can disable it and the
outputs go back to follow the inputs.
D. The DSH goes high but this is not read
because HO is off.
E. The LO signal is on and the low side IGBT
desaturates, the low side behaviour is the
same as described in point B.
F.
The DSL goes high but this is not read
because LO is off.
G. As point A (anti-shoot through).
Referred to logic diagram figure 18:
A. The device is in hold state, regardless of input
variations. Hold state is forced by SY_FLT
forced low externally
B. The device outputs goes off by hard
shutdown, externally commanded. A through
B is the same sequence adopted by another
IR2214 device in SSD procedure.
C. Externally driven low FAULT/SD (shutdown
state) cannot be disabled by forcing FLT_CLR
(see FAULT/SD section).
D. The FAULT/SD is released and the outputs
go back to follow the inputs.
E. Externally driven low FAULT/SD: outputs go
off by hard shutdown (like point B).
F. As point A and B but for the low side output.
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