參數(shù)資料
型號: IDT70121L55JG
廠商: INTEGRATED DEVICE TECHNOLOGY INC
元件分類: DRAM
英文描述: HIGH-SPEED 2K x 9 DUAL-PORT STATIC RAM WITH BUSY & INTERRUPT
中文描述: 2K X 9 DUAL-PORT SRAM, 55 ns, PQCC52
封裝: 0.75 X 0.75 INCH, 0.17 INCH HEIGHT, GREEN, PLASTIC, LCC-52
文件頁數(shù): 9/15頁
文件大?。?/td> 139K
代理商: IDT70121L55JG
9
IDT70121/IDT70125
High-Speed 2K x 9 Dual-Port Static RAM with Busy & Interrupt Industrial and Commercial Temperature Ranges
T iming Waveform of Write Cycle No. 1, R/
W
Controlled T iming
(1,5,8)
t
WC
APRIL 05, 2006
NOTES:
1. R/
W
or
CE
must be HIGH during all address transitions.
2. A write occurs during the overlap (t
EW
or t
WP
) of a
CE
= V
IL
and a R/
W
= V
IL
3. t
WR
is measured fromthe earlier of
CE
or R/
W
going HIGH to the end of the write cycle.
4. During this period, the I/O pins are in the output state and input signals must not be applied.
5. If the
CE
LOW transition occurs simultaneously with or after the R/
W
LOW transition, the outputs remain in the High-impedance state.
6. Timng depends on which enable signal (
CE
or R/
W
) is asserted last.
7. This parameter is determned be device characterization, but is not production tested. Transition is measured 0mV fromsteady state with the Output Test Load
(Figure 2).
8. If
OE
is LOW during a R/
W
controlled write cycle, the write pulse width must be the larger of t
WP
or (t
WZ
+ t
DW
) to allow the I/O drivers to turn off data to be
placed on the bus for the required t
DW
. If
OE
is HIGH during a R/
W
controlled write cycle, this requirement does not apply and the write pulse can be as short
as the specified t
WP
.
T iming Waveform of Write Cycle No. 2,
CE
Controlled T iming
(1,5)
R/
W
t
HZ
t
AW
t
HZ
t
AS
t
WP
DATA
OUT
t
DW
t
DH
t
OW
OE
ADDRESS
DATA
IN
CE
t
WZ
(4)
(4)
t
WR
2654 drw 07
(3)
(7)
(2)
(6)
(7)
(7)
CE
t
WC
t
AS
t
WR
t
DW
t
DH
ADDRESS
DATA
IN
R/
W
t
AW
t
EW
2654 drw 08
(6)
(2)
(3)
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