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參數(shù)資料
| 型號： | IDT5T915 |
| 廠商： | Integrated Device Technology, Inc. |
| 英文描述： | 2.5V DIFFERENTIAL 1:5 CLOCK BUFFER TERABUFFER |
| 中文描述： | 2.5V的差動(dòng)1:5時(shí)鐘緩沖器TERABUFFER |
| 文件頁數(shù)： | 7/19頁 |
| 文件大?。?/td> | 127K |
| 代理商： | IDT5T915 |
INDUSTRIAL TEMPERATURE RANGE
IDT5T915
2.5V DIFFERENTIAL 1:5 CLOCK BUFFER TERABUFFER
POWER SUPPLY CHARACTERISTICS FOR eHSTL OUTPUTS
(1)
Symbol
Parameter
I
DDQ
Quiescent V
DD
Power Supply Current
V
DDQ
= Max., Reference Clock = LOW
(3)
Outputs enabled, All outputs unloaded
I
DDQQ
Quiescent V
DDQ
Power Supply Current
V
DDQ
= Max., Reference Clock = LOW
(3)
Outputs enabled, All outputs unloaded
I
DDD
Dynamc V
DD
Power Supply
V
DD
= Max., V
DDQ
= Max., C
L
= 0pF
Current per Output
I
DDDQ
Dynamc V
DDQ
Power Supply
V
DD
= Max., V
DDQ
= Max., C
L
= 0pF
Current per Output
I
TOT
Total Power V
DD
Supply Current
V
DDQ
= 1.8V, F
REFERENCE
CLOCK
= 100MHz, C
L
= 15pF
V
DDQ
= 1.8V, F
REFERENCE
CLOCK
= 250MHz, C
L
= 15pF
I
TOTQ
Total Power V
DDQ
Supply Current
V
DDQ
= 1.8V, F
REFERENCE
CLOCK
= 100MHz, C
L
= 15pF
V
DDQ
= 1.8V, F
REFERENCE
CLOCK
= 250MHz, C
L
= 15pF
7
Test Conditions
(2)
Typ.
20
Max
30
Unit
mA
0.1
0.3
mA
20
30
μ
A/MHz
40
60
μ
A/MHz
20
35
40
80
40
50
80
160
mA
mA
NOTES:
1. These power consumption characteristics are for all the valid input interfaces and cover the worst case input and output interface combinations.
2. The termnation resistors are excluded fromthese measurements.
3. If the differential input interface is used, the true input is held LOW and the complementary input is held HIGH.
DIFFERENT IAL INPUT AC T ES T CONDIT IONS FOR eHS T L
Symbol
Parameter
V
DIF
Input Signal Swing
(1)
V
X
Differential Input Signal Crossing Point
(2)
V
THI
Input Timng Measurement Reference Level
(3)
t
R
, t
F
Input Signal Edge Rate
(4)
NOTES:
1. The 1V peak-to-peak input pulse level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. Compliant devices must meet the
V
DIF
(AC) specification under actual use conditions.
2. A 900mV crossing point level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. Compliant devices must meet the V
X
specification
under actual use conditions.
3. In all cases, input waveformtimng is marked at the differential cross-point of the input signals.
4. The input signal edge rate of 1V/ns or greater is to be maintained in the 20% to 80% range of the input waveform
Value
1
900
Units
V
mV
V
V/ns
Crossing Point
1
DC ELECTRICAL CHARACTERISTICS OV ER OPERATING RANGE FOR
LVEPECL
(1)
Symbol
Parameter
Test Conditions
Input Characteristics
I
IH
Input HIGH Current
(6)
V
DD
= 2.6V
I
IL
Input LOW Current
(6)
V
DD
= 2.6V
V
IK
Clamp Diode Voltage
V
DD
= 2.4V, I
IN
= -18mA
V
IN
DC Input Voltage
V
CM
DC Common Mode Input Voltage
(3,5)
V
REF
Single-Ended Reference Voltage
(4,5)
V
IH
DC Input HIGH
V
IL
DC Input LOW
NOTES:
1. See RECOMMENDED OPERATING RANGE table.
2. Typical values are at V
DD
= 2.5V, +25°C ambient.
3. V
CM
specifies the maximumallowable range of (V
TR
+ V
CP
) /2. Differential mode only.
4. For single-ended operation while in differential mode,
A
/V
REF
is tied to the DC Voltage V
REF
.
5. The reference clock input is capable of HSTL, eHSTL, LVEPECL, 1.8V or 2.5V LVTTL operation independent of the device output. The correct input interface table should
be referenced.
6. For differential mode (RxS = LOW), A and
A
/V
REF
must be at the opposite rail.
Min.
Typ.
(2)
Max
Unit
V
I
= V
DDQ
/GND
V
I
= GND/V
DDQ
—
—
—
- 0.3
915
—
1275
555
—
—
- 0.7
—
1082
1082
—
—
±5
±5
- 1.2
3.6
1248
—
1620
875
μ
A
V
V
mV
mV
mV
mV
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