Semiconductor Group
24
HYB 3116(7)400BJ/BT(L) -50/-60/-70
3.3V 4Mx4-DRAM
CAS-Before-RAS Refresh Counter Test Cycle
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t
CSR
t
ASR
t
ASC
t
CHR
t
CP
t
RAL
t
CAH
t
RSH
t
CAS
t
RP
t
RAS
t
CAC
t
AA
t
WRH
t
OEA
t
CLZ
t
DZO
t
OEZ
t
OFF
t
RWL
t
CWL
t
WCH
t
WCS
t
WRH
t
WRP
t
DS
t
DH
VIH
VIL
VIH
VIL
VIH
VIL
VOH
VOL
VIH
VIL
VIH
VIL
VIH
VIL
VIH
VIL
VIH
VIL
VIH
VIL
VIH
VIL
RAS
I/O
(Inputs)
OE
WE
Address
CAS
I/O
(Outputs)
I/O
(Outputs)
I/O
(Inputs)
WE
OE
Column
Row
Data Out
Data In
HI-Z
Read Cycle:
Write Cycle:
t
RRH
t
RCH