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參數(shù)資料
| 型號： | HFA3860IV96 |
| 廠商： | HARRIS SEMICONDUCTOR |
| 元件分類： | 無繩電話/電話 |
| 英文描述： | 11 Mbps Direct Sequence Spread Spectrum Baseband Processor |
| 中文描述： | TELECOM, CELLULAR, BASEBAND CIRCUIT, PQFP48 |
| 文件頁數(shù)： | 33/40頁 |
| 文件大?。?/td> | 250K |
| 代理商： | HFA3860IV96 |
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4-33
Bits 7:0
Test Bus Address = 0Ah
Bit Sync Accum Lo Rate
Test 7:0 = Bit Sync Accumulator (7:0)
TEST_CLK = Sample CLK
Bits 7:0
Test Bus Address = 0Bh
Test PN Gen.,
Factory Test Only
Test 7:0 +TEST_CLK = Top 9 bits of PN generator used for fault tests.
Bits 7:0
Test Bus Address = 0Ch
A/D Cal Test Mode
Test 7 = A/D CAL (Full Scale)
Test 6 = ED, Energy Detect Comparator Output
Test 5 = A/D_CAL Disable
Test(4:0) = A/D_Cal(4:0)
TEST_CLK =A/D_Cal CLK
Bits 7:0
Test Bus Address = 0Dh
Correlator I High Rate,
tests the MBOK I correlator output.
Test 7:0 = Correlator I Hi Rate (8:1)
TEST_CLK = Sample CLK
Bits 7:0
Test Bus Address = 0Eh
Correlator Q High Rate,
tests the MBOK Q correlator output.
Test 7:0 = Correlator Q Hi Rate (8:1)
TEST_CLK = Sample CLK
Bits 7:0
Test Bus Address = 0Fh
Chip Error Accumulator,
Test 7:0 = Chip Error Accumulator (14:7)
TEST_CLK = 0
Bits 7:0
Test Bus Address = 10h
NCO Test Hi Rate,
tests the NCO in the high rate tracking section.
Test 7:0 = NCO Accum (19:12)
TEST_CLK = Sample CLK
Bits 7:0
Test Bus Address = 11h
FREQ Test Hi Rate,
tests the NCO lag accumulator in the high rate tracking section.
Test 7:0 = Lag Accum (18:11)
TEST_CLK = Sample CLK
Bits 7:0
Test Bus Address = 12h
Carrier Phase Error Hi Rate
Test 7:0 = Carrier Phase Error (6,6:0)
TEST_CLK = Sample CLK
Bits 7:0
Test Bus Address = 13h
I_ROT Hi Rate,
tests the I Channel phase rotation error signal.
Test 7:0 = I_ROT (5,5,5:0)
TEST_CLK = Sample CLK
Bits 7:0
Test Bus Address = 14h
Q_ROT Hi Rate
Test 7:0 = Q_ROT (5,5,5:0)
TEST_CLK = Sample CLK
Bits 7:0
Test Bus Address = 15h
I_A/D, Q_A/D,
tests the I and Q Channel 3-bit A/D Converters.
Test 7:6 = 0
Test 5:3 = I_A/D (2:0)
Test 2:0 = Q_A/D (2:0)
TEST_CLK = Sample CLK
Bits 7:0
Test Bus Address = 16h
XOR Hi Rate,
Factory Test Only
Test 7:0 + TEST_CLK = 9 bits of registered XOR test data from the high rate logic.
CONFIGURATION REGISTER 28 ADDRESS (70h) TEST BUS ADDRESS (Continued)
Supplies address for test pin outputs and Test Bus Monitor Register
HFA3860
相關PDF資料 |
PDF描述 |
|---|---|
| HFA3861A | Direct Sequence Spread Spectrum Baseband Processor(直接序列擴頻基帶處理器) |
| HFA3861B | Direct Sequence Spread Spectrum Baseband Processor(直接序列擴譜基帶處理器) |
| HFA3861 | Direct Sequence Spread Spectrum (DSSS) baseband processor(直接序列擴頻基帶處理器) |
| HFA3861IV | Direct Sequence Spread Spectrum Baseband Processor |
| HFA3861IV96 | Direct Sequence Spread Spectrum Baseband Processor |
相關代理商/技術參數(shù) |
參數(shù)描述 |
|---|---|
| HFA3861 | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Direct Sequence Spread Spectrum Baseband Processor |
| HFA3861A | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Direct Sequence Spread Spectrum Baseband Processo |
| HFA3861AIN | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Direct Sequence Spread Spectrum Baseband Processo |
| HFA3861AIN96 | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Direct Sequence Spread Spectrum Baseband Processo |
| HFA3861B | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Direct Sequence Spread Spectrum Baseband Processor |
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