參數(shù)資料
型號(hào): GS8170S72
廠商: GSI TECHNOLOGY
英文描述: 16Mb(256K x 72Bit)Synchronous SRAM(16M位(256K x 72位)同步靜態(tài)RAM)
中文描述: 16Mb的(256 × 72Bit)同步SRAM(1,600位(256 × 72位)同步靜態(tài)內(nèi)存)
文件頁(yè)數(shù): 22/38頁(yè)
文件大小: 934K
代理商: GS8170S72
Rev: 1.01 11/2000
Specifications cited are design targets and are subject to change without notice. For latest documentation contact your GSI representative.
22/38
2000, Giga Semiconductor, Inc.
A
Advanced Information
GS8170S18/36/72B-333/300/275/250
CMOS I/O DC Input Characteristics
Capacitance
(T
A
= 25
o
C, f = 1 MH
Z
, V
DD
= 3.3 V)
Note: This parameter is sample tested.
Package Thermal Characteristics
Notes:
1.
Junction temperature is a function of SRAM power dissipation, package thermal resistance, mounting board temperature, ambient.
Temperature air flow, board density, and PCB thermal resistance.
SCMI G-38-87
Average thermal resistance between die and top surface, MIL SPEC-883, Method 1012.1
2.
3.
Parameter
Symbol
V
IH
V
IL
Min.
Typ.
Max.
V
DD
+ 0.3
0.35 * V
DDQ
Unit
Notes
CMOS Input High Voltage
0.65 * V
DDQ
V
2
CMOS Input Low Voltage
Note: For devices supplied with CMOS input buffers. Compatible with both 1.8 V and 1.5 V I/O drivers.
–0.3
V
2
Parameter
Symbol
C
IN
C
OUT
Test conditions
V
IN
= 0 V
V
OUT
= 0 V
Typ.
Max.
Unit
Input Capacitance
4
5
pF
Output Capacitance
6
7
pF
Rating
Layer Board
Symbol
R
Θ
JA
R
Θ
JA
R
Θ
JC
Max
Unit
°
C/W
°
C/W
°
C/W
Notes
Junction to Ambient (at 200 lfm)
single
TBD
1,2
Junction to Ambient (at 200 lfm)
four
TBD
1,2
Junction to Case (TOP)
n/a
TBD
3
20% tKC
V
SS
– 1.0 V
50%
V
SS
V
IH
Undershoot Measurement and Timing
Overshoot Measurement and Timing
20% tKC
V
DD
+ 1.0 V
50%
V
DD
V
IL
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