參數(shù)資料
型號(hào): EPM570
廠商: Altera Corporation
英文描述: JTAG & In-System Programmability
中文描述: JTAG接口
文件頁數(shù): 2/10頁
文件大?。?/td> 103K
代理商: EPM570
3–2
MAX II Device Handbook, Volume 1
Core Version a.b.c variable
Altera Corporation
June 2004
IEEE Std. 1149.1 (JTAG) Boundary Scan Support
HIGHZ
(1)
00 0000 1011
Places the 1-bit bypass register between the
TDI
and
TDO
pins, which allows the boundary scan test data to pass
synchronously through selected devices to adjacent devices
during normal device operation, while tri-stating all of the I/O
pins.
CLAMP
(1)
00 0000 1010
Places the 1-bit bypass register between the
TDI
and
TDO
pins, which allows the boundary scan test data to pass
synchronously through selected devices to adjacent devices
during normal device operation, while holding I/O pins to a
state defined by the data in the boundary-scan register.
USER0
00 0000 1100
This instruction allows the user to define their own scan chain
between
TDI
and
TDO
in the MAX II logic array. This
instruction is also used for custom logic and JTAG interfaces.
USER1
00 0000 1110
This instruction allows the user to define their own scan chain
between
TDI
and
TDO
in the MAX II logic array. This
instruction is also used for custom logic and JTAG interfaces.
IEEE 1532 instructions
(2)
IEEE 1532 ISC instructions used when programming a MAX II
device via the JTAG port.
Notes to
Table 3–1
:
(1)
HIGHZ
,
CLAMP
, and
EXTEST
instructions do not disable weak pull-up resistors or bus hold features.
(2)
These instructions are shown in the 1532 BSDL files, which will be posted on the Altera
web site at
www.altera.com
when they are available.
Table 3–1. MAX II JTAG Instructions (Part 2 of 2)
JTAG Instruction
Instruction Code
Description
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