
DS26519 16-Port T1/E1/J1 Transceiver
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NAME
PIN
TYPE
FUNCTION
WRB
/
RWB
R13
Input
Write-Read Bar/Read-Write Bar.
This active-low signal along with
CSB
qualifies
write access to one of the DS26519 registers. Data at D[7:0] is written into the
addressed register at the rising edge of
WRB
while
CSB
is low.
Interrupt Bar.
This active-low output is asserted when an unmasked interrupt
event is detected.
INTB
will be deasserted (and tri-stated) when all interrupts
have been acknowledged and serviced. Extensive mask bits are provided at the
global level, framer, LIU, and BERT level.
SPI Serial Bus Mode Select
0 = Parallel Bus Mode
1 = SPI Serial Bus Mode
Bus Type Select.
Set high to select Motorola bus timing, low to select Intel bus
timing. This pin controls the function of the
RDB/DSB
and
WRB
pins.
Note:
If SPI
mode is selected by the SPI_SEL pin, this pin must be tied low.
SYSTEM INTERFACE
Master Clock.
This is an independent free-running clock whose input can be a
multiple of 2.048MHz ±50ppm or 1.544MHz ±50ppm. The clock selection is
available by bits MPS0 and MPS1 and FREQSEL. Multiple of 2.048MHz can be
internally adapted to 1.544MHz. Multiple of 1.544MHz can be adapted to
2.048MHz. Note that TCLKn must be 2.048MHz for E1 and 1.544MHz for T1/J1
operation. See
Table 10-14
.
Reset Bar.
Active-low reset. This input forces the complete DS26519 reset. This
includes reset of the registers, framers, and LIUs.
Reference Clock Input/Output
Input:
A 2.048MHz or 1.544MHz clock input. This clock can be used to generate
the backplane clock. This allows for the users to synchronize the system
backplane with the reference clock. The other options for the backplane clock
reference are LIU-received clocks or MCLK.
Output:
This signal can also be used to output a 1.544MHz or 2.048MHz
reference clock. This allows for multiple DS26519s to share the same reference
for generation of the backplane clock. Hence, in a system consisting of multiple
DS26519s, one can be a master and others a slave using the same reference
clock.
TEST
Digital Enable.
When this pin and
JTRST
are pulled low, all digital I/O pins are
placed in a high-impedance state. If this pin is high the digital I/O pins operate
normally. This pin must be connected to V
DD
for normal operation.
JTAG Reset.
JTRST
is used to asynchronously reset the test access port
controller. After power-up,
JTRST
must be toggled from low to high. This action
sets the device into the JTAG DEVICE ID mode. Pulling
JTRST
low restores
normal device operation.
JTRST
is pulled high internally via a 10k
Ω
resistor
operation. If boundary scan is not used, this pin should be held low.
JTAG Mode Select.
This pin is sampled on the rising edge of JTCLK and is used
to place the test access port into the various defined IEEE 1149.1 states. This pin
has a 10k
Ω
pullup resistor.
JTAG Clock.
This signal is used to shift data into JTDI on the rising edge and out
of JTDO on the falling edge.
JTAG Data In.
Test instructions and data are clocked into this pin on the rising
edge of JTCLK. This pin has a 10k
Ω
pullup resistor.
INTB
U9
Output/
Tri-
Stateable
SPI_SEL
F5
Input
BTS
U15
Input
MCLK
F11
Input
RESETB
T16
Input
REFCLKIO
A18
Input/
Output
DIGIOEN
A14
Input,
Pullup
JTRST
F4
Input,
Pullup
JTMS
G4
Input,
Pullup
JTCLK
E3
Input
JTDI
G5
Input,
Pullup
Output,
High
Impedance
Input
JTDO
E4
JTAG Data Out.
Test instructions and data are clocked out of this pin on the
falling edge of JTCLK. If not used, this pin should be left unconnected.
SCANEN
N6
Scan Enable.
When low, the device is in normal operation. User should tie low.
Scan Mode.
When low, normal operational clocks are used to clock the flip flops.
User should tie low.
SCANMODE
V18
Input
TST_TA1
TST_TB1
TST_TC1
TST_RA1
TST_RB1
TST_RC1
T6
K1
R6
K2
P6
L2
Output
LIU Test Points.
Test signals from LIU 1. User should leave unconnected.