| 型號(hào) | 廠(chǎng)商 | 描述 |
| 1n4571aurtr-2 2 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4571aurtr-3 2 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4571tr 2 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4571tr-1 2 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4571ur 2 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4571ur-1 2 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4571ur-1-1 2 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4571ur-1-2 2 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4571ur-3 2 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4571urtr 2 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4571urtr-1 2 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4571urtr-1-1 2 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4573a-3 2 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4573atr 2 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4573atr-1 2 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4573atr-1-1 2 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4573atr-1-2 2 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4573atr-1-3 2 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4573atr-2 2 |
Microsemi Corporation | Octal D-Type Transparent Latches 20-SSOP 0 to 70 |
| 1n4573atr-3 2 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4573aur 2 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4573aur-1 2 |
MICROSEMI CORP-LAWRENCE | Octal D-Type Transparent Latches 20-SOIC 0 to 70 |
| 1n4573aur-1-1 2 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4573aur-2 2 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4573aur-3 2 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4573aurtr 2 |
Microsemi Corporation | Octal D-Type Transparent Latches 20-PDIP 0 to 70 |
| 1n4573aurtr-1 2 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4573aurtr-1-1 2 |
Microsemi Corporation | Octal D-Type Transparent Latches 20-SO 0 to 70 |
| 1n4576-3 2 3 4 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4576a-2 2 3 4 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4576a-3 2 3 4 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4576atr 2 3 4 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4576tr-1-2 2 3 4 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4576tr-3 2 3 4 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4576ur-1 2 3 4 |
Microsemi Corporation | IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers 24-SOIC 0 to 70 |
| 1n4576ur-1-1 2 3 4 |
Microsemi Corporation | IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers 24-SOIC 0 to 70 |
| 1n4576ur-1-2 2 3 4 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4576ur-3 2 3 4 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4576urtr 2 3 4 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4576urtr-1 2 3 4 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4576urtr-1-1 2 3 4 |
Microsemi Corporation | IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-SOIC 0 to 70 |
| 1n4576urtr-3 2 3 4 |
Microsemi Corporation | IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-SOIC 0 to 70 |
| 1n4577-3 2 3 4 |
Microsemi Corporation | IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-SOIC 0 to 70 |
| 1n4577a-3 2 3 4 |
Microsemi Corporation | IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-PDIP 0 to 70 |
| 1n4577atr 2 3 4 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4577atr-1 2 3 4 |
Microsemi Corporation | IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers 24-SOIC 0 to 70 |
| 1n4577tr-2 2 3 4 |
Microsemi Corporation | Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops 24-SOIC 0 to 70 |
| 1n4577tr-3 2 3 4 |
Microsemi Corporation | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1n4577ur 2 3 4 |
Microsemi Corporation | Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops 24-SOIC 0 to 70 |
| 1n4577ur-1 2 3 4 |
Microsemi Corporation | Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops 24-SOIC 0 to 70 |