參數(shù)資料
型號(hào)： 1N4576URTR-1
廠商： Microsemi Corporation
英文描述： 6.4 Volt Temperature Compensated Zener Reference Diodes
中文描述： 6.4伏參考溫度補(bǔ)償齊納二極管
文件頁(yè)數(shù)： 2/4頁(yè)
文件大?。?/td> 246K
代理商： 1N4576URTR-1
6.4 Volt Temperature Compensated Zener
Reference Diodes
SCOTTSD A L E DIVISION
1N4565 thru 1N4584A-1 DO-7
W
.Mi
cr
os
em
i
.C
O
M
1N4565(A)(-1)
thru
1N
45
84
(A
)(-
1)
D
O
-7
*ELECTRICAL CHARACTERISTICS @ 25oC, unless otherwise specified
MAXIMUM VOLTAGE TEMPERATURE
COEFFICIENT
JEDEC TYPE
Number
(Notes 1, 4 & 5)
ZENER TEST
CURRENT
(Note 3)
IZT
mA
αVZ +/- %/oC
+/- mV/
oC
Temp. Range
MAXIMUM
REVERSE
CURRENT
IR @ 3 V
A
MAX. DYNAMIC
IMPEDANCE
(Note 2)
ZZT @ IZT
OHMS
1N4565
1N4565A
.5
.01
.64
0 to +75
oC
-55 to +100
oC
2.0
200
1N4566
1N4566A
.5
.005
.32
0 to +75
oC
-55 to +100
oC
2.0
200
1N4567
1N4567A
.5
.002
.13
0 to +75
oC
-55 to +100
oC
2.0
200
1N4568
1N4568A
.5
.001
.06
0 to +75
oC
-55 to +100
oC
2.0
200
1N4569
1N4569A
.5
.0005
.03
0 to +75
oC
-55 to +100
oC
2.0
200
1N4570
1N4570A
.5
.01
.64
0 to +75
oC
-55 to +100
oC
2.0
100
1N4571
1N4571A
1.0
.005
.32
0 to +75
oC
-55 to +100
oC
2.0
100
1N4572
1N4572A
1.0
.002
.13
0 to +75
oC
-55 to +100
oC
2.0
100
1N4573
1N4573A
1.0
.001
.06
0 to +75
oC
-55 to +100
oC
2.0
100
1N4574
1N4574A
1.0
.0005
.03
0 to +75
oC
-55 to +100
oC
2.0
100
1N4575
1N4575A
2.0
.01
.64
0 to +75
oC
-55 to +100
oC
2.0
50
1N4576
1N4576A
2.0
.005
.32
0 to +75
oC
-55 to +100
oC
2.0
50
1N4577
1N4577A
2.0
.002
.13
0 to +75
oC
-55 to +100
oC
2.0
50
1N4578
1N4578A
2.0
.001
.06
0 to +75
oC
-55 to +100
oC
2.0
50
1N4579
1N4579A
2.0
.0005
.03
0 to +75
oC
-55 to +100
oC
2.0
50
1N4580
1N4580A
4.0
.01
.64
0 to +75
oC
-55 to +100
oC
2.0
25
1N4581
1N4581A
4.0
.005
.32
0 to +75
oC
-55 to +100
oC
2.0
25
1N4582
1N4582A
4.0
.002
.13
0 to +75
oC
-55 to +100
oC
2.0
25
1N4583
1N4583A
4.0
.001
.06
0 to +75
oC
-55 to +100
oC
2.0
25
1N4584
1N4584A
4.0
.0005
.03
0 to +75
oC
-55 to +100
oC
2.0
25
*JEDEC Registered Data.
NOTES:
1.
When ordering devices with tighter tolerances than specified for the VZ voltage nominal of 6.40V, add a hyphened suffix to the
part number for desired tolerance, e.g. 1N4569A-2%, 1N4574A-1-1%, 1N4579-1-2%, 1N4584A-1-3%, etc.
2.
Zener impedance is measured by superimposing 0.75 mA ac rms on 7.5 mA dc @ 25
oC.
3.
Voltage measurements to be performed 15 seconds after application of dc test current IZT.
4.
1N4565 thru 1N4584 also have qualification to MIL-PRF-19500/452 by adding the JAN, JANTX, JANTXV, or
JANS prefixes to part numbers as well as the “-1” suffix; e.g. JANTX1N4569A-1, JANTXV1N4574A-1, etc.
5.
Designate Radiation Hardened devices with “RH” prefix instead of “1N,” i.e., RH4584A.
Microsemi
Scottsdale Division
8700 E. Thomas Rd. PO Box 1390, Scottsdale, AZ 85252 USA, (480) 941-6300, Fax: (480) 947-1503
Page 2
Copyright
2003
10-27-2003 REV B
相關(guān)PDF資料
PDF描述
1N4576URTR-1-1 IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-SOIC 0 to 70
1N4576URTR-3 IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-SOIC 0 to 70
1N4577-3 IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-SOIC 0 to 70
1N4577A-3 IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-PDIP 0 to 70
1N4577ATR 6.4 Volt Temperature Compensated Zener Reference Diodes
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