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參數(shù)資料
| 型號： | 1N4577TR-3 |
| 廠商： | Microsemi Corporation |
| 英文描述： | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 中文描述： | 6.4伏參考溫度補(bǔ)償齊納二極管 |
| 文件頁數(shù)： | 3/4頁 |
| 文件大?。?/td> | 246K |
| 代理商： | 1N4577TR-3 |
6.4 Volt Temperature Compensated Zener
Reference Diodes
SCOTTSD A L E DIVISION
1N4565 thru 1N4584A-1 DO-7
W
.Mi
cr
os
em
i
.C
O
M
1N4565(A)(-1)
thru
1N4584(A)(-1)
DO-7
GRAPHS
Typical change of
Typical Change
Temperature Coefficient
in Zener Voltage
with change in
Operating Current
T
C
(m
V
/C
)
TC
(%/C
V
Z(mV)
IZ – Operating Current (mA)
1N4565 – 1N4569A
T
C
(m
V
/C
)
TC
(%/C
V
Z(mV)
IZ – Operating Current (mA)
1N4570 – 1N4574A
T
C
(m
V
/C
)
TC
(%/C
V
Z(mV)
IZ – Operating Current (mA)
1N4575 – 1N4579A
Microsemi
Scottsdale Division
8700 E. Thomas Rd. PO Box 1390, Scottsdale, AZ 85252 USA, (480) 941-6300, Fax: (480) 947-1503
Page 3
Copyright
2003
10-27-2003 REV B
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| 1N4577UR | Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops 24-SOIC 0 to 70 |
| 1N4577UR-1 | Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops 24-SOIC 0 to 70 |
| 1N4577UR-1-1 | 6.4 Volt Temperature Compensated Zener Reference Diodes |
| 1N4577UR-1-2 | Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops 24-PDIP 0 to 70 |
| 1N4577URTR | 6.4 Volt Temperature Compensated Zener Reference Diodes |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| 1N4578 | 制造商:Microsemi Corporation 功能描述:ZENER SGL 6.4V 5% 500MW 2PIN DO-35 - Bulk |
| 1N4578-1 | 制造商:Microsemi Corporation 功能描述:ZENER SGL 6.4V 5% 500MW 2PIN DO-35 - Bulk |
| 1N4578A | 制造商:Microsemi Corporation 功能描述:Diode Zener Single 6.4V 5% 500mW 2-Pin DO-35 制造商:Microsemi Corporation 功能描述:ZENER SGL 6.4V 5% 500MW 2PIN DO-35 - Bulk |
| 1N4578A-1 | 制造商:Microsemi Corporation 功能描述:ZENER SGL 6.4V 5% 500MW 2PIN DO-35 - Bulk |
| 1N4578AUR-1 | 功能描述:Zener Diode 制造商:microsemi corporation 系列:* 零件狀態(tài):在售 標(biāo)準(zhǔn)包裝:1 |
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