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參數(shù)資料
| 型號(hào)： | CY7C1245V18-300BZI |
| 廠商： | CYPRESS SEMICONDUCTOR CORP |
| 元件分類： | DRAM |
| 英文描述： | 36-Mbit QDR⑩-II+ SRAM 4-Word Burst Architecture (2.0 Cycle Read Latency) |
| 中文描述： | 1M X 36 QDR SRAM, 0.45 ns, PBGA165 |
| 封裝： | 15 X 17 MM, 1.40 MM HEIGHT, MO-216, FBGA-165 |
| 文件頁數(shù)： | 23/28頁 |
| 文件大?。?/td> | 1042K |
| 代理商： | CY7C1245V18-300BZI |
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CY7C1241V18
CY7C1256V18
CY7C1243V18
CY7C1245V18
Document Number: 001-06365 Rev. *C
Page 23 of 28
Switching Characteristics
Over the Operating Range
[21, 22]
Cypress
Parameter
Consortium
Parameter
Description
375 MHz
Min
1
2.66
0.4
0.4
333 MHz
Min
1
3.0
0.4
0.4
1.28
300 MHz
Min
1
3.3
0.4
0.4
1.40
Unit
Max
–
8.4
–
–
–
Max
–
8.4
–
–
–
Max
–
8.4
–
–
–
t
POWER
t
CYC
t
KH
t
KL
t
KHKH
Set-up Times
t
SA
t
SC
t
SCDDR
V
DD
(Typical) to the First Access
[23]
K Clock Cycle Time
Input Clock (K/K) HIGH
Input Clock (K/K) LOW
K Clock Rise to K Clock Rise (rising edge to rising edge) 1.13
ms
ns
t
CYC
t
CYC
ns
t
KHKH
t
KHKL
t
KLKH
t
KHKH
t
AVKH
t
IVKH
t
IVKH
Address Set-up to K Clock Rise
Control Set-up to K Clock Rise (RPS, WPS)
Double Data Rate Control Set-up to Clock (K, K) Rise
(BWS
0
, BWS
1,
BWS
2
, BWS
3
)
D
[X:0]
Set-up to Clock (K/K) Rise
0.4
0.4
0.28
–
–
–
0.4
0.4
0.28
–
–
–
0.4
0.4
0.28
–
–
–
ns
ns
ns
t
SD
Hold Times
t
HA
t
HC
t
HCDDR
t
DVKH
0.28
–
0.28
–
0.28
–
ns
t
KHAX
t
KHIX
t
KHIX
Address Hold after K Clock Rise
Control Hold after K Clock Rise (RPS, WPS)
Double Data Rate Control Hold after Clock (K/K) Rise
(BWS
0
, BWS
1,
BWS
2
, BWS
3
)
D
[X:0]
Hold after Clock (K/K) Rise
0.4
0.4
0.28
–
–
–
0.4
0.4
0.28
–
–
–
0.4
0.4
0.28
–
–
–
ns
ns
ns
t
HD
Output Times
t
CO
t
DOH
t
KHDX
0.28
–
0.28
–
0.28
–
ns
t
CHQV
t
CHQX
K/K Clock Rise to Data Valid
Data Output Hold after Output K/K Clock Rise
(Active to Active)
K/K Clock Rise to Echo Clock Valid
Echo Clock Hold after K/K Clock Rise
Echo Clock High to Data Valid
Echo Clock High to Data Invalid
Output Clock (CQ/CQ) HIGH
[24]
CQ Clock Rise to CQ Clock Rise
[24]
(rising edge to rising edge)
Clock (K/K) Rise to High-Z (Active to High-Z)
[25, 26]
Clock (K/K) Rise to Low-Z
[25, 26]
Echo Clock High to QVLD Valid
[27]
–
0.45
–
–
0.45
–
–
0.45
–
ns
ns
–0.45
–0.45
–0.45
t
CCQO
t
CQOH
t
CQD
t
CQDOH
t
CQH
t
CQHCQH
t
CHCQV
t
CHCQX
t
CQHQV
t
CQHQX
t
CQHCQL
t
CQHCQH
–
0.45
–
0.2
–
–
–
–
0.45
–
0.2
–
–
–
–
0.45
–
0.2
–
–
–
ns
ns
ns
ns
ns
ns
–0.45
–0.45
–0.45
–0.2
0.88
0.88
–0.2
1.03
1.03
–0.2
1.15
1.15
t
CHZ
t
CLZ
t
QVLD
DLL Timing
t
KC Var
t
KC lock
t
KC Reset
t
CHQZ
t
CHQX1
t
CQHQVLD
–
0.45
–
–
0.45
–
–
0.45
–
ns
ns
ns
–0.45
–0.20 0.20 –0.20 0.20 –0.20 0.20
–0.45
–0.45
t
KC Var
t
KC lock
t
KC Reset
Clock Phase Jitter
DLL Lock Time (K)
K Static to DLL Reset
[28]
–
0.20
–
–
–
0.20
–
–
–
0.20
–
–
ns
2048
30
2048
30
2048
30
Cycles
ns
Notes
22.When a part with a maximum frequency above 300 MHz is operating at a lower clock frequency, it requires the input timings of the frequency range in which it is
being operated and will output data with the output timing of that frequency range.
23.This part has an internal voltage regulator; t
POWER
is the time that the power needs to be supplied above V
DD
minimum initially before a read or write operation
can be initiated.
24.These parameters are extrapolated from the input timing parameters (t
– 250 ps, where 250 ps is the internal jitter. An input jitter of 200 ps (t
KC Var
) is already
included in the t
). These parameters are only guaranteed by design and are not tested in production.
25.t
, t
are specified with a load capacitance of 5 pF as in part (b) of
“AC Test Loads and Waveforms” on page 22
. Transition is measured
±
100 mV from
steady-state voltage.
26.At any voltage and temperature t
is less than t
and t
less than t
CO
.
27.t
spec is applicable for both rising and falling edges of QVLD signal.
28.Hold to >V
IH
or <V
IL
.
[+] Feedback
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