參數(shù)資料
型號: CY7C1021CV33-10ZXC
廠商: CYPRESS SEMICONDUCTOR CORP
元件分類: DRAM
英文描述: 1-Mbit (64K x 16) Static RAM
中文描述: 64K X 16 STANDARD SRAM, 10 ns, PDSO44
封裝: LEAD FREE, TSOP2-44
文件頁數(shù): 6/13頁
文件大?。?/td> 379K
代理商: CY7C1021CV33-10ZXC
CY7C1021CV33
Document #: 38-05132 Rev. *G
Page 6 of 13
Switching Characteristics
Over the Operating Range
[7]
Parameter
Read Cycle
t
power[8]
t
RC
t
AA
t
OHA
t
ACE
t
DOE
t
LZOE
t
HZOE
t
LZCE
t
HZCE
t
PU[11]
t
PD[11]
t
DBE
t
LZBE
t
HZBE
Write Cycle
[12]
t
WC
t
SCE
t
AW
t
HA
t
SA
t
PWE
t
SD
t
HD
t
LZWE
t
HZWE
t
BW
Description
-8
-10
-12
-15
Unit
Min.
Max.
Min.
Max.
Min.
Max.
Min.
Max.
V
CC
(typical) to the first access
Read Cycle Time
Address to Data Valid
Data Hold from Address Change
CE LOW to Data Valid
OE LOW to Data Valid
OE LOW to Low-Z
[9]
OE HIGH to High-Z
[9, 10]
CE LOW to Low-Z
[9]
CE HIGH to High-Z
[9, 10]
CE LOW to Power-Up
CE HIGH to Power-Down
Byte Enable to Data Valid
Byte Enable to Low-Z
Byte Disable to High-Z
100
8
100
10
100
12
100
15
μ
s
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
8
10
12
15
3
3
3
3
8
5
10
5
12
6
15
7
0
0
0
0
4
5
6
7
3
3
3
3
4
5
6
7
0
0
0
0
8
5
10
5
12
6
15
7
0
0
0
0
4
5
6
7
Write Cycle Time
CE LOW to Write End
Address Set-up to Write End
Address Hold from Write End
Address Set-up to Write Start
WE Pulse Width
Data Set-up to Write End
Data Hold from Write End
WE HIGH to Low-Z
[9]
WE LOW to High-Z
[9, 10]
Byte Enable to End of Write
8
7
7
0
0
6
5
0
3
10
8
8
0
0
7
5
0
3
12
9
9
0
0
8
6
0
3
15
10
10
0
0
10
8
0
3
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
4
5
6
7
6
7
8
9
Notes:
7. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V.
8. t
gives the minimum amount of time that the power supply should be at typical V
values until the first memory access is performed.
9. At any given temperature and voltage condition, t
is less than t
, t
is less than t
, and t
is less than t
for any given device.
10.t
, t
HZBE
, t
HZCE
, and t
HZWE
are specified with a load capacitance of 5 pF as in part (d) of AC Test Loads. Transition is measured
±
500 mV from steady-state
voltage.
11. This parameter is guaranteed by design and is not tested.
12.The internal Write time of the memory is defined by the overlap of CE LOW, WE LOW and BHE/BLE LOW. CE, WE and BHE/BLE must be LOW to initiate a
Write, and the transition of these signals can terminate the Write. The input data set-up and hold timing should be referenced to the leading edge of the signal
that terminates the Write.
[+] Feedback
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