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參數(shù)資料
| 型號： | AU5790D14-T |
| 英文描述： | LAN TRANSCEIVER|SINGLE|SOP|14PIN|PLASTIC |
| 中文描述： | 網(wǎng)絡(luò)收發(fā)器|單|專科| 14PIN |塑料 |
| 文件頁數(shù)： | 8/19頁 |
| 文件大?。?/td> | 165K |
| 代理商： | AU5790D14-T |
Philips Semiconductors
Preliminary specification
AU5790
Single wire CAN transceiver
8
SYMBOL
UNIT
MAX.
TYP.
MIN.
CONDITIONS
PARAMETER
Pin CANH (continued)
–I
CANHH
Bus short circuit current in
high-speed mode
V
CANH
= –1 V,
TxD = 0 V; NSTB = 5 V; EN = 0 V;
8 V < V
BAT
< 16 V
0 V < V
BAT
< 16 V;
see Figure 2 in the test circuits
section
50
190
mA
I
CANLG
Bus leakage current at loss of
ground
(I_CAN_LG = I_CANH + I_RTH)
–50
50
μ
A
T
sd
T
hys
V
T
Thermal shutdown
Note 2
155
190
°
C
°
C
Thermal shutdown hysteresis
Note 2
5
15
Bus input threshold
5.8 V < V
BAT
< 27 V,
all modes except sleep mode
1.8
2.2
V
V
TL
Bus input threshold, low battery
5.5 V < V
BAT
< 5.8 V,
all modes except sleep mode
1.5
2.2
V
V
TS
Bus input threshold in sleep mode
NSTB = 0 V, EN = 0 V,
V
BAT
> 11.3 V
NSTB = 0 V, EN = 0 V,
5.5 V < V
BAT
< 11.3 V
6.15
8.1
V
V
TSL
Bus input threshold in sleep mode,
low battery
V
BAT
– 4.3
V
BAT
– 3.25
V
Pin RTH
V
RTH1
V
RTH2
Pins NSTB, EN
Voltage on switched ground pin
I
RTH
= 1 mA
I
RTH
= 6 mA
0.1
V
Voltage on switched ground pin
1
V
V
ih
V
il
I
i
Pin TxD
High level input voltage
5.5 V < V
BAT
< 27 V
5.5 V < V
BAT
< 27 V
V
i
= 1 V and V
i
= 5 V
3
V
Low level input voltage
1
V
μ
A
Input current
15
50
V
itxd
–I
itxd
–I
ihtxd
TxD input threshold
5.5 V < V
BAT
< 27 V
V
TxD
= 0 V
NSTB = 0 V, EN = 0 V,
V
TxD
= 5 V; 5.5 V < V
BAT
< 14 V
1
3
V
μ
A
TxD low level input current
50
180
TxD high level input current in
sleep mode
–5
10
μ
A
Pin RxD
V
olrxd
RxD low level output voltage
I
RxD
= 2.2 mA;
V
CANH
= 10 V, all modes
V
RxD
= 5 V; V
CANH
= 10 V
V
RxD
= 5 V; V
CANH
= 0 V,
all modes
0.45
V
I
rxd
I
ohrxd
RxD low level output current
3
30
mA
RxD high level leakage
–10
+10
μ
A
NOTES:
1. Operation at battery voltages higher than 16 V is recommended to be shorter than 2 minutes.
2. This parameter is characterized but not subject to production test.
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