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參數(shù)資料
| 型號： | AN-5002 |
| 廠商： | Fairchild Semiconductor Corporation |
| 英文描述： | LJT 18C 18#20 SKT WALL RECP |
| 中文描述： | GTLP：單與多路輸出開關(guān)技術(shù)探討 |
| 文件頁數(shù)： | 1/3頁 |
| 文件大?。?/td> | 38K |
| 代理商： | AN-5002 |
2001 Fairchild Semiconductor Corporation
AN500190
www.fairchildsemi.com
Fairchild Semiconductor
Application Note
September 1998
Revised February 2001
A
AN-5002
GTLP: Single vs. Multiple Output Switching Technical
Discussion
Abstract
Single Output Switching (SOS) specifications are provided
by the supplier as a tool to allow a cursory look at the per-
formance of a device. Actual performance is highly depen-
dent on the application in which it is used. The inclusion of
Multiple Output Switching (MOS) specifications gives an
additional data point to use when determining the change
in relative performance of a device. Derating curves pro-
vide a number of additional data points to assist in deter-
mining the change in relative performance of a device.
This application note provides a description of SOS and
MOS specifications that can be used to integrate new
devices into a design. These tools must be used with cau-
tion when calculating parameters such as timing budgets in
actual applications. The testing conditions used in setting
standard specifications for a datasheet are most likely dif-
ferent than the actual loading and conditioning of the
devices in an application.
Definitions
Single Output Switching
Single Output Switching (SOS) describes the
single bit
propagation delay performance of a device. The tested
propagation delay performance is statistically processed
into a
standardized
specification that is used in datasheets
to provide a way to compare similar products from compet-
ing suppliers.
Multiple Output Switching
Multiple Output Switching (MOS) describes the
multiple bit
propagation delay performance of a device. The word “mul-
tiple” usually refers to
8, 16 or 32 bits
, depending on the
total number of data bits that the device has. It can also
refer to any other combination of multiple switching data
bits, but is always two or more.
The MOS measurement conditions usually mimic the SOS
conditions except for multiple bit switching. There is not a
standardized methodology for specifying performance,
making it somewhat difficult to compare similar products
from competing suppliers.
Specifications
The datasheet specifications of propagation delay perfor-
mance usually have only SOS specifications. Some IC
suppliers provide
Extended AC Electrical Characteristics
that include MOS propagation delay performance and der-
ating curves. This extended data gives a useful compari-
son to standard SOS specifications in a controlled test
environment.
The test measuring conditions or testing environment for
SOS and MOS rely on controlled parameters such as test
loads, trace lengths and impedances, and frequency of
operation. While the measurement conditions seem far
removed from an actual application, they are currently the
best standardized test conditions that are available to
describe device propagation delay performance.
Understanding Specifications
Datasheet specifications (SOS, MOS or any other parame-
ter) try to best describe the device performance in near-
realistic applications. Currently the SOS and MOS propa-
gation delay performance is measured using 30pF/25
or
50pF/500
lumped loads for the Gunning Transceiver
Logic Plus (GTLP) family of products. The configuration of
the TTL load can be modelled as shown in Figure 1. The
output pull-up value of 6V is used for 3.3V V
CC
operation.
When testing SOS propagation delay performance, each of
the single bit paths are measured separately with the test
load. Each single bit is remeasured over the range of oper-
ating V
CC
and temperature. The statistical minimum, maxi-
mum, and mean of the sample of single bit paths are then
used to calculate the databook specification.
When testing MOS propagation delay performance all bit
paths are simultaneously switched in phase with the test
sense probe being moved to measure each output. The
load capacitance can be varied for additional extended AC
electrical characteristics. Typically, derating curves of prop-
agation delay versus load, use lumped load capacitances
of 10 pF, 30 pF, 50 pF, 100 pF and at times 250 pF.
FIGURE 1. AC Test Circuit
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PDF描述 |
|---|---|
| AN-5025 | Applications Using the GTLP10B320 |
| AN-5026 | Circular Connector; No. of Contacts:19; Series:MS27656; Body Material:Aluminum; Connecting Termination:Crimp; Connector Shell Size:15; Circular Contact Gender:Pin; Circular Shell Style:Wall Mount Receptacle; Insert Arrangement:15-19 RoHS Compliant: No |
| AN-5031 | GTLP Power Configuration |
| AN-5058 | Family Frequently Asked Questions (FAQs) |
| AN-5061 | Layout Guidelines |
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