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參數(shù)資料
| 型號(hào)： | AN-03 |
| 英文描述： | SONET OC-12 Jitter Measurement |
| 中文描述： | 與SONET OC - 12抖動(dòng)測(cè)量 |
| 文件頁(yè)數(shù)： | 2/6頁(yè) |
| 文件大小： | 56K |
| 代理商： | AN-03 |
APPLICATION NOTE
AN-03
2
Micrel
Figure 2b
Test Setup for Measuring Jitter Generation
on the SY69712 Receive
CH 1
Filter
CKE622
SY69712
(recovered clock)
SDIN
622MHz
HP 70820A Microwave Transition Analyzer &
HP 70004A Display
HP 70841B Pattern Generator &
HP 70311A Clock Source
HP 3325B Synthesizer
Function Generator
Figure 2a
Test Setup for Measuring Jitter Generation
on the SY69612 and SY69712 Transmit
JITTER GENERATION (continued)
Measuring Jitter Generation on the SY69712 Transmit
Jitter generation is measured on the CKE622 output from
the device. This output is a differential ECL signal at the
622.08MHz rate that is synthesized from the reference clock
input of 77.76MHz, 51.84MHz or 19.44MHz. Figure 2a shows
the test setup for measuring jitter generation on the SY69712
transmit.
Measuring Jitter Generation on the SY69712 Receive
Jitter generation is measured on the CKE622 (recovered
clock) output from the device. This output is recovered from
the clock recovery circuit. Figure 2b shows the test setup for
measuring jitter generation on the SY69712 receive.
CH 1
Filter
CKE622
RFCLKIN
HP 70820A Microwave Transition Analyzer &
HP 70004A Display
HP 70841B Pattern Generator &
HP 70311A Clock Source
77.76MHz,
51.84MHz
or
19.44MHz
SY69612
&
SY69712
÷ 8 / ÷ 12 / ÷ 32
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