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      參數(shù)資料
      型號(hào): AM50DL128CG70IS
      廠(chǎng)商: ADVANCED MICRO DEVICES INC
      元件分類(lèi): 存儲(chǔ)器
      英文描述: 64 Megabit (4 M x 16-Bit) CMOS 3.0 Volt-only, Simultaneous Operation Flash Memories and 64 Mbit (4 M x 16-Bit) Pseudo Static RAM
      中文描述: SPECIALTY MEMORY CIRCUIT, PBGA88
      封裝: 11.60 X 8 MM, FBGA-88
      文件頁(yè)數(shù): 13/63頁(yè)
      文件大?。?/td> 464K
      代理商: AM50DL128CG70IS
      12
      Am50DL128CG
      November 7, 2002
      P R E L I M I N A R Y
      FLASH DEVICE BUS OPERATIONS
      Word Configuration
      The device is in word configuration, DQ15–DQ0 are
      active and controlled by CE#f and OE#.
      Requirements for Reading Array Data
      To read array data from the outputs, the system must
      drive the CE#f and OE# pins to V
      IL
      . CE#f is the power
      control and selects the device. OE# is the output con-
      trol and gates array data to the output pins. WE#
      should remain at V
      IH
      .
      The internal state machine is set for reading array data
      upon device power-up, or after a hardware reset. This
      ensures that no spurious alteration of the memory
      content occurs during the power transition. No com-
      mand is necessary in this mode to obtain array data.
      Standard microprocessor read cycles that assert valid
      addresses on the device address inputs produce valid
      data on the device data outputs. Each bank remains
      enabled for read access until the command register
      contents are altered.
      Refer to the Flash Read-Only Operations table for tim-
      ing specifications and to Figure 15 for the timing dia-
      gram. I
      CC1
      in the DC Characteristics table represents
      the active current specification for reading array data.
      Writing Commands/Command Sequences
      To write a command or command sequence (which in-
      cludes programming data to the device and erasing
      sectors of memory), the system must drive WE# and
      CE#f to V
      IL
      , and OE# to V
      IH
      .
      For program operations, the CIOf pin determines
      whether the device accepts program data in bytes or
      words. Refer to “Flash Device Bus Operations” for
      more information.
      The device features an
      Unlock Bypass
      mode to facil-
      itate faster programming. Once a bank enters the Un-
      lock Bypass mode, only two write cycles are required
      to program a word or byte, instead of four.
      An erase operation can erase one sector, multiple sec-
      tors, or the entire device. Table 2 indicates the address
      space that each sector occupies. Similarly, a “sector
      address” is the address bits required to uniquely select
      a sector. The “Flash Command Definitions” section
      has details on erasing a sector or the entire chip, or
      suspending/resuming the erase operation.
      The device address space is divided into four banks. A
      “bank address” is the address bits required to uniquely
      select a bank.
      I
      CC2
      in the DC Characteristics table represents the ac-
      tive current specification for the write mode. The Flash
      AC Characteristics section contains timing specifica-
      tion tables and timing diagrams for write operations.
      Accelerated Program Operation
      The device offers accelerated program operations
      through the ACC function. This is one of two functions
      provided by the WP#/ACC pin. This function is prima-
      rily intended to allow faster manufacturing throughput
      at the factory.
      If the system asserts V
      HH
      on this pin, the device auto-
      matically enters the aforementioned Unlock Bypass
      mode, temporarily unprotects any protected sectors,
      and uses the higher voltage on the pin to reduce the
      time required for program operations. The system
      would use a two-cycle program command sequence
      as required by the Unlock Bypass mode. Removing
      V
      HH
      from the WP#/ACC pin returns the device to nor-
      mal operation.
      Note that V
      HH
      must not be asserted on
      WP#/ACC for operations other than accelerated pro-
      gramming, or device damage may result. In addition,
      the WP#/ACC pin must not be left floating or uncon-
      nected; inconsistent behavior of the device may result
      .
      See “Write Protect (WP#)” on page 18 for related in-
      formation.
      Autoselect Functions
      If the system writes the autoselect command se-
      quence, the device enters the autoselect mode. The
      system can then read autoselect codes from the inter-
      nal register (which is separate from the memory array)
      on DQ15–DQ0. Standard read cycle timings apply in
      this mode. Refer to the Sector/Sector Block Protection
      and Unprotection and Autoselect Command Se-
      quence sections for more information.
      Simultaneous Read/Write Operations with
      Zero Latency
      This device is capable of reading data from one bank
      of memory while programming or erasing in the other
      bank of memory. An erase operation may also be sus-
      pended to read from or program to another location
      within the same bank (except the sector being
      erased). Figure 20 shows how read and write cycles
      may be initiated for simultaneous operation with zero
      latency. I
      CC6
      f and I
      CC7
      f in the table represent the cur-
      rent specifications for read-while-program and
      read-while-erase, respectively.
      Standby Mode
      When the system is not reading or writing to the de-
      vice, it can place the device in the standby mode. In
      this mode, current consumption is greatly reduced,
      and the outputs are placed in the high impedance
      state, independent of the OE# input.
      The device enters the CMOS standby mode when the
      CE#f and RESET# pins are both held at V
      CC
      ± 0.3 V.
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