參數(shù)資料
型號: ADS8422IBPFBR
廠商: TEXAS INSTRUMENTS INC
元件分類: ADC
英文描述: 1-CH 16-BIT SUCCESSIVE APPROXIMATION ADC, PARALLEL ACCESS, PQFP48
封裝: 9 X 9 MM, GREEN, PLASTIC, TQFP-48
文件頁數(shù): 12/28頁
文件大小: 1310K
代理商: ADS8422IBPFBR
www.ti.com
ABSOLUTE MAXIMUM RATINGS
(1)
SLAS512B – JUNE 2006 – REVISED DECEMBER 2006
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
ORDERING INFORMATION(1)
MAXIMUM
INTEGRAL
NO MISSING CODES
PACKAGE
TEMPERATURE
ORDERING
TRANSPORT
MODEL
DIFFERENTIAL
LINEARITY
RESOLUTION (BIT)
TYPE
DESIGNATOR
RANGE
INFORMATION
MEDIA QTY.
LINEARITY (LSB)
(LSB)
Small tape and
ADS8422IPFBT
reel 250
9
×9 48-Pin
ADS8422I
±6
±2
15
PFB
–40
°C to 85°C
TQFP
Tape and reel
ADS8422IPFBR
1000
Small tape and
ADS8422IBPFBT
reel 250
9
×9 48-Pin
ADS8422IB
±2
+1.5/-1
16
PFB
–40
°C to 85°C
TQFP
Tape and reel
ADS8422IBPFBR
1000
(1)
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com.
over operating free-air temperature range (unless otherwise noted)
VALUE
UNIT
+IN to AGND
–0.4 to +VA + 0.1
V
–IN to AGND
–0.4 to +VA + 0.1
V
Voltage
+VA to AGND
–0.3 to 7
V
+VBD to BDGND
–0.3 to 7
V
Digital input voltage to BDGND
–0.3 to +VBD + 0.3
V
Digital output voltage to BDGND
–0.3 to +VBD + 0.3
V
TA
Operating free-air temperature range
–40 to 85
°C
Tstg
Storage temperature range
–65 to 150
°C
Junction temperature (TJ max)
150
°C
Power dissipation
(TJMax – TA)/θJA
TQFP 48-pin package
θ
JA thermal impedance
86
°C/W
Vapor phase (60 sec)
215
°C
Lead temperature, soldering
Infrared (15 sec)
220
°C
(1)
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
2
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