
–4–
REV. 0
AD9854–SPECIFICATIONS
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although
the AD9854 features proprietary ESD protection circuitry, permanent damage may occur on
devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are
recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
Test
Level
AD9854ASQ
Typ
AD9854AST
Typ
Parameter
POWER SUPPLY
6
+V
S
Current
7
+V
S
Current
8
+V
Current
9
P
DS
P
DISS8
P
DISS9
P
DISS
Power-Down Mode
Temp
Min
Max
Min
Max
Unit
25
°
C
25
°
C
25
°
C
25
°
C
25
°
C
25
°
C
25
°
C
I
I
I
I
I
I
I
1050
710
600
3.475
2.345
1.975
1
1210
816
685
4.190
2.825
2.375
50
755
515
435
2.490
1.700
1.435
1
865
585
495
3.000
2.025
1.715
50
mA
mA
mA
W
W
W
mW
NOTES
1
The reference clock inputs are configured to accept a 1 V p-p (minimum) dc offset sine wave centered at one-half the applied V
DD
or a 3 V TTL-level pulse input.
2
The I and Q gain imbalance is digitally adjustable to less than 0.01 dB.
3
Change in duty cycle from 1 MHz to 100 MHz with 1 V p-p sine wave input and 0.5 V threshold.
4
Represents comparator’s inherent cycle-to-cycle jitter contribution. Input signal is a 1 V, 40 MHz square wave. Measurement device Wavecrest DTS – 2075.
5
Comparator input originates from analog output section via external 7-pole elliptic LPF. Single-ended input, 0.5 V p-p. Comparator output terminated in 50
.
6
Simultaneous operation at the maximum ambient temperature of 85
°
C and the maximum internal clock frequency of 200 MHz for the 80-lead LQFP, or 300 MHz
for the thermally-enhanced 80-lead LQFP may cause the maximum die junction temperature of 150
°
C to be exceeded. Refer to the section titled Power Dissipation
and Thermal Considerations for derating and thermal management information.
7
All functions engaged.
8
All functions except inverse sinc engaged.
9
All functions except inverse sinc and digital multipliers engaged.
Specifications subject to change without notice.
EXPLANATION OF TEST LEVELS
Test Level
I
– 100% Production Tested.
III – Sample Tested Only.
IV
– Parameter is guaranteed by design and characterization
testing.
V
– Parameter is a typical value only.
VI
– Devices are 100% production tested at 25
°
C and
guaranteed by design and characterization testing
for industrial operating temperature range.
ABSOLUTE MAXIMUM RATINGS
*
Maximum Junction Temperature . . . . . . . . . . . . . . . . 150
°
C
V
S
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 V
Digital Inputs . . . . . . . . . . . . . . . . . . . . . . . . . –0.7 V to +V
S
Digital Output Current . . . . . . . . . . . . . . . . . . . . . . . . . 5 mA
Storage Temperature . . . . . . . . . . . . . . . . . . –65
°
C to +150
°
C
Operating Temperature . . . . . . . . . . . . . . . . . –40
°
C to +85
°
C
Lead Temperature (Soldering, 10 sec) . . . . . . . . . . . . 300
°
C
Maximum Clock Frequency . . . . . . . . . . . . . . . . . . 300 MHz
*
Absolute maximum ratings are limiting values, to be applied individually, and
beyond which the serviceability of the circuit may be impaired. Functional
operability under any of these conditions is not necessarily implied. Exposure of
absolute maximum rating conditions for extended periods of time may affect device
reliability.
ORDERING GUIDE
Model
Temperature Range
–40
°
C to +85
°
C
–40
°
C to +85
°
C
0
°
C to 70
°
C
Package Description
Package Option
AD9854ASQ
AD9854AST
AD9854/PCB
Thermally-Enhanced 80-Lead LQFP
80-Lead LQFP
Evaluation Board
SQ-80
ST-80