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| 型號： | AD7939BCP |
| 廠商： | ANALOG DEVICES INC |
| 元件分類： | ADC |
| 英文描述： | 8-Channel, 1.5 MSPS, 12-Bit and 10-Bit Parallel ADCs with a Sequencer |
| 中文描述： | 8-CH 10-BIT SUCCESSIVE APPROXIMATION ADC, PARALLEL ACCESS, QCC32 |
| 封裝： | MO-220-VHHD-2, LFCSP-32 |
| 文件頁數(shù)： | 8/32頁 |
| 文件大?。?/td> | 1332K |
| 代理商： | AD7939BCP |
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AD7938/AD7939
Preliminary Technical Data
ABSOLUTE MAXIMUM RATINGS
T
A
= 25°C, unless otherwise noted.
Table 4.
Parameter
V
DD
to AGND/DGND
V
DRIVE
to AGND/DGND
Analog Input Voltage to AGND
Digital Input Voltage to DGND
V
DRIVE
to V
DD
Digital Output Voltage to DGND
V
REFIN
to AGND
AGND to DGND
Input Current to Any Pin Except
Supplies
1
Operating Temperature Range
Commercial (B Version)
Storage Temperature Range
Junction Temperature
θ
JA
Thermal Impedance
θ
JC
Thermal Impedance
Lead Temperature, Soldering
Reflow Temperature (10 sec to 30 sec)
ESD
Rating
0.3 V to +7 V
0.3 V to V
DD
+0.3 V
0.3 V to V
DD
+ 0.3 V
0.3 V to 7 V
0.3 V to V
DD
+ 0.3 V
0.3 V to V
DRIVE
+ 0.3 V
0.3 V to V
DD
+ 0.3 V
0.3 V to + 0.3 V
±10 mA
40°C to +85°C
65°C to +150°C
150°C
108.2°C/W (LFCSP)
121°C/W (TQFP)
32.71°C/W (LFCSP)
45°C/W (TQFP)
255°C
2 kV
1
Transient currents of up to 100 mA will not cause SCR latch-up.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate
on the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Rev. PrN | Page 8 of 32
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