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參數(shù)資料
| 型號(hào)： | AD7568 |
| 廠商： | Analog Devices, Inc. |
| 英文描述： | Octal 12-Bit DAC(LC2MOS八通道12位D/A轉(zhuǎn)換器) |
| 中文描述： | 八通道12位DAC（LC2MOS八通道12位的D / A轉(zhuǎn)換器） |
| 文件頁數(shù)： | 5/12頁 |
| 文件大小： | 251K |
| 代理商： | AD7568 |
AD7568
REV. B
–5–
T E RMINOLOGY
Relative Accuracy
Relative Accuracy or endpoint linearity is a measure of the
maximum deviation from a straight line passing through the
endpoints of the DAC transfer function. It is measured after
adjusting for zero error and full-scale error and is normally ex-
pressed in Least Significant Bits or as a percentage or full-scale
reading.
Differential Nonlinearity
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of 1 LSB maximum
ensures monotonicity.
Gain E rror
Gain Error is a measure of the output error between an ideal
DAC and the actual device output. It is measured with all 1s in
the DAC after offset error has been adjusted out and is
expressed in Least Significant Bits. Gain error is adjustable to
zero with an external potentiometer.
Output Leakage Current
Output leakage current is current which flows in the DAC lad-
der switches when these are turned off. For the I
OUT 1
terminal,
it can be measured by loading all 0s to the DAC and measuring
the I
OUT 1
current. Minimum current will flow in the I
OUT 2
line
when the DAC is loaded with all 1s. T his is a combination of
the switch leakage current and the ladder termination resistor
current. T he I
OUT 2
leakage current is typically equal to that in
I
OUT 1
.
Output Capacitance
T his is the capacitance from the I
OUT 1
pin to AGND.
Output Voltage Settling T ime
T his is the amount of time it takes for the output to settle to a
specified level for a full-scale input change. For the AD7568, it
is specified with the AD843 as the output op amp.
Digital to Analog Glitch Impulse
T his is the amount of charge injected into the analog output
when the inputs change state. It is normally specified as the area
of the glitch in either pA-secs or nV-secs, depending upon
whether the glitch is measured as a current or voltage signal. It
is measured with the reference input connected to AGND and
the digital inputs toggled between all 1s and all 0s.
AC Feedthrough E rror
T his is the error due to capacitive feedthrough from the DAC
reference input to the DAC I
OUT
terminal, when all 0s are
loaded in the DAC.
Channel-to-Channel Isolation
Channel-to-channel isolation refers to the proportion of input
signal from one DAC’s reference input which appears at the
output of any other DAC in the device and is expressed in dBs.
Digital Crosstalk
T he glitch impulse transferred to the output of one converter
due to a change in digital input code to the other converter is
defined as the Digital Crosstalk and is specified in nV-secs.
Digital Feedthrough
When the device is not selected, high frequency logic activity on
the device digital inputs is capacitively coupled through the de-
vice to show up as noise on the I
OUT
pin and subsequently on
the op amp output. T his noise is digital feedthrough.
T able I. AD7568 Loading Sequence
DB15
D B11 D B10
D B0
D S0
D B9
D B8
D B7
D B6
D B5
D B4
D B3
D B2
D B1
D B0
A0
D S2
D S1
T able II. DAC Selection
DS2
DS1
DS0
Function
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
DAC A Selected
DAC B Selected
DAC C Selected
DAC D Selected
DAC E Sclected
DAC F Selected
DAC G Sclected
DAC H Selected
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