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參數(shù)資料
| 型號： | AD5170EVAL |
| 廠商： | Analog Devices, Inc. |
| 元件分類： | 數(shù)字電位計 |
| 英文描述： | 256-Position Two-Time Programmable I2C Digital Potentiometer |
| 中文描述： | 256位二時間的I2C可編程數(shù)字電位器 |
| 文件頁數(shù)： | 11/24頁 |
| 文件大小： | 900K |
| 代理商： | AD5170EVAL |
AD5170
TEST CIRCUITS
Figure 24 to Figure 29 illustrate the test circuits that define the
test conditions used in the product specification tables.
Rev. A | Page 11 of 24
0
V
MS
A
W
B
DUT
V+
V+ = V
1LSB = V+/2
N
Figure 24. Test Circuit for Potentiometer Divider Nonlinearity Error (INL, DNL)
0
NO CONNECT
I
W
V
MS
A
W
B
DUT
Figure 25. Test Circuit for Resistor Position Nonlinearity Error
(Rheostat Operation; R-INL, R-DNL)
0
V
MS2
V
MS1
V
W
A
W
B
DUT
I
W
= V
DD
/R
NOMINAL
R
W
= [V
MS1
– V
MS2
]/I
W
Figure 26. Test Circuit for Wiper Resistance
0
V
MS
%
V
DD
%
DUT
( )
A
W
B
V+
MS
V
DD
V
A
V
MS
V+ = V
DD
± 10%
PSRR (dB) = 20 LOG
PSS (%/%) =
Figure 27. Test Circuit for Power Supply Sensitivity (PSS, PSSR)
0
+15V
–15V
W
A
2.5V
B
V
OUT
OFFSET
GND
DUT
AD8610
V
IN
Figure 28. Test Circuit for Gain vs. Frequency
W
B
V
CM
I
CM
A
NC
GND
NC
V
DD
DUT
NC = NO CONNECT
0
Figure 29. Test Circuit for Common-Mode Leakage Current
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