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參數(shù)資料
| 型號(hào)： | AD5060 |
| 廠商： | Analog Devices, Inc. |
| 英文描述： | Full Accurate 14/16 Bit Vout nanoDac Buffered, 3V/5V, Sot 23 |
| 中文描述： | 全面準(zhǔn)確14/16輸出電壓nanoDAC系列緩沖，3V/5V，索23位 |
| 文件頁(yè)數(shù)： | 7/17頁(yè) |
| 文件大?。?/td> | 829K |
| 代理商： | AD5060 |
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Preliminary Technical Data
AD5040/AD5060
Rev. PrC | Page 7 of 17
TERMINOLOGY
Relative Accuracy
For the DAC, relative accuracy or Integral Nonlinearity (INL)
is a measure of the maximum deviation, in LSBs, from a straight line
passing through the endpoints of the DAC transfer function. A
typical INL vs. code plot can be seen in Figure 2.
Differential Nonlinearity
Differential Nonlinearity (DNL) is the difference between the
measured change and the ideal 1 LSB change between any two
adjacent codes. A specified differential nonlinearity of ±1 LSB
maximum ensures monotonicity. This DAC is
guaranteed monotonic by design. A typical DNL vs. code plot
can be seen in Figure 3.
Zero-Code Error
Zero-code error is a measure of the output error when zero
code (0000Hex) is loaded to the DAC register. Ideally the
output should be 0 V. The zero-code error is always positive in
the AD5040/AD5060 because the output of the DAC cannot go
below 0 V. It is due to a combination of the offset errors in the
DAC and output amplifier. Zero-code error is expressed in mV.
A plot of zero-code error vs. temperature can be seen in Figure
6.
Full-Scale Error
Full-scale error is a measure of the output error when full-scale
code (FFFF Hex) is loaded to the DAC register. Ideally the
output should be VDD – 1 LSB. Full-scale error is expressed in
percent of full-scale range. A plot of full-scale error vs.
temperature can be seen in Figure 6.
Gain Error
This is a measure of the span error of the DAC. It is the
deviation in slope of the DAC transfer characteristic from ideal
expressed as a percent of the full-scale range.
Total Unadjusted Error
Total Unadjusted Error (TUE) is a measure of the output error
taking all the various errors into account. A typical TUE vs.
code plot can be seen in Figure 4.
Zero-Code Error Drift
This is a measure of the change in zero-code error
with a change in temperature. It is expressed in μV/°C.
Gain Error Drift
This is a measure of the change in gain error with changes in
temperature. It is expressed in (ppm of full-scale range)/°C.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV secs
and is measured when the digital input code is
changed by
1 LSB at the major carry transition (7FFF Hex to 8000 Hex). See
Figure 19.
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into
the analog output of the DAC from the digital inputs of the
DAC but is measured when the DAC output is not updated. It
is specified in nV secs and measured with a full-scale
code change on the data bus, i.e., from all 0s to all 1s and vice
versa.
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