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參數(shù)資料
| 型號： | A1174EEWLT-T |
| 元件分類： | 磁阻傳感器 |
| 英文描述： | MAGNETIC FIELD SENSOR-HALL EFFECT, -5.5-5.5mT, 300mV, RECTANGULAR, SURFACE MOUNT |
| 封裝： | 1.50 X 2 MM, 0.40 MM HEIGHT, LEAD FREE, DFN-6 |
| 文件頁數(shù)： | 2/13頁 |
| 文件大?。?/td> | 423K |
| 代理商： | A1174EEWLT-T |
Ultrasensitive Hall Effect Latch
with Internally or Externally Controlled Sample and Sleep Periods
for Track Ball and Scroll Wheel Applications
A1174
10
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
Initially, the device operates in the slow sampling state with a
typical sleep time duration, tsleep_slow. The awake time duration,
tawake, is common in all defined modes of operation. After the
first output state transition, the device switches into the fast sam-
pling state, with a sleep time duration, tsleep_fast, of 8 × tawake_dual.
Fast input sampling ensures that the device does not miss any
subsequent transitions of the incident magnetic field. This is
advantageous in applications such as track ball monitoring, when
the track ball can be rotated at very high speeds. If there is no
output switching for the duration of the specified timeout, ttimeout,
then the device switches back into the slow sampling state to
conserve battery life in handheld devices.
Figure 7 shows the case in which the field does not change within
the ttimeout period. The behavior of the device in the presence of a
rapidly changing magnetic field is shown in figure 8.
Has
SleepTimer
expired?
Magnetic
field change?
ReturnTimer
expired?
Reset
ReturnTimer
to ttimeout
Sample magnetic field
during tawake_dual
YES
NO
Update device
output
Dual Clock Mode
Initial State
Set SleepTimer
to tsleep_slow
Set SleepTimer
to tsleep_slow
Set SleepTimer
to tsleep_fast
NO
YES
NO
Figure 6. Dual Clock mode operation algorithm
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