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參數(shù)資料
| 型號(hào)： | 992215732011 |
| 廠商： | NXP SEMICONDUCTORS |
| 元件分類： | 模擬信號(hào)調(diào)理 |
| 英文描述： | SPECIALTY ANALOG CIRCUIT, CDIP32 |
| 封裝： | CERAMIC, DIP-32 |
| 文件頁數(shù)： | 15/16頁 |
| 文件大?。?/td> | 234K |
| 代理商： | 992215732011 |
2000 January
8
Philips Semiconductors
Product specification
Frame Transfer CCD Image Sensor
FT 18
Performance
The performance of the FT 18 is described for modes of operation
with 25 frames/sec or 30 frames/sec respectively. Measurements
for the FT 18 are done under the following circumstances (values in
brackets apply for the 30 frames/sec mode):
VNS is adjusted as low as possible while maintaining proper
Vertical Anti-Blooming.
Integration takes place under 2 gates with 10V clock swing during
40ms (33.33ms)
The vertical transport or frame shift frequency equals 750kHz
(714kHz).
The horizontal transport or read-out frequency equals 36MHz
(40MHz).
The RMS read-out noise of the output buffers and the FPN are
measured in the bandwidth 0.1-18MHz (0.1-20MHz).
The performance in dark is given at a temperature of 318K / 45°C.
Note that the dark current decreases by a factor of two for every
decrease of temperature of approximately 10°C.
1 White Shading is defined as the ratio of the one-
σ value of an 8x8 pixel blurred image (low-pass) to the mean signal value.
2 Random Non Uniformity is defined as the ratio of the one-
σ value of the highpass image to the mean signal value at nominal light.
3 Q
max is determined from the lowpass filtered image.
4 Q
max of the output register may be increased up to 200kel. In this case the charge packets of the pixels may get mixed in the output register
during horizontal transport. This may reduce the number of times that the output register needs to be read out if lines are read out solely to be
dumped.
5 The smear condition is: overexposure with a spot with a height of 10% of the image height (approx. 100 lines).
Linear / Saturation
Min.
Typical
Max.
Unit
Overexposure over entire area while maintaining good VAB
Vertical resolution (MTF) @ 67 lp/mm
Quantum efficiency @ 450 nm
Quantum efficiency @ 520 nm
Quantum efficiency @ 600 nm
Quantum efficiency @ 800 nm (near IR)
Image lag
White Shading
1
Random Non-Uniformity (RNU)
2
Full-well capacity Floating Diffusion (FD)
Full-well capacity saturation level (Q
max )
3 image
Full-well capacity saturation level (Q
max ) storage
Full-well capacity saturation level (Q
max ) output register
4
300
25
10
21
18
5
-
120
40
45
90
-
11
22
19
-
0
-
1.0
-
45
-
2.5
1.4
-
lux
%
kel.
25 frames/sec mode only
Sensitivity @ 3200K without IR cut-off filter
Smear without shutter
5
Dynamic range
RMS read-out noise
5.6
-
60
-
5.8
-
63.8
29
-
0.39
-
38
kel/lux
%
dB
el
30 frames/sec mode only
Sensitivity @ 3200K without IR cut-off filter
Smear without shutter
5
Dynamic range
RMS read-out noise
4.6
-
60
-
4.8
-
63.5
30
-
0.40
-
40
kel/lux
%
dB
el
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