參數(shù)資料
型號(hào): 5962F9215315VMC
元件分類: SRAM
英文描述: 32K X 8 STANDARD SRAM, 70 ns, CDIP28
封裝: 0.600 X 1.400 INCH, 0.100 INCH PITCH, SIDE BRAZED, CERAMIC, DIP-28
文件頁(yè)數(shù): 14/15頁(yè)
文件大小: 144K
代理商: 5962F9215315VMC
8
AC CHARACTERISTICS WRITE CYCLE (Post-Radiation)*
(VDD = 5.0V ±10%) (-55°C to +125°C)
Notes:
* Post-radiation performance guaranteed at 25
°C per MIL-STD-883 Method 1019.
1. Functional test performed with outputs disabled (
G high).
2. Three-state is defined as 500mV change from steady-state output voltage.
SYMBOL
PARAMETER
7156-40
MIN
MAX
7156-55
MIN
MAX
7156-70
MIN
MAX
UNIT
tAVAV
1
Write cycle time
40
55
70
ns
tETWH
Device enable to end of write
35
50
65
ns
tAVET
Address setup time for write (E1 or E2 -
controlled)
0
ns
tAVWL
Address setup time for write (W - controlled)
0
ns
tWLWH
Write pulse width
35
40
50
ns
tWHAX
Address hold time for write (W - controlled)
0
ns
tEFAX
Address hold time for device enable (E1 or E2 -
controlled)
0
ns
tWLQZ
2
W - controlled three-state time
15
20
25
ns
tWHQX
2
W - controlled output enable time
1
0
ns
tETEF
Device enable pulse width (E1 or E2 - controlled)
35
50
65
ns
tDVWH
Data setup time
30
40
50
ns
tWHDX
Data hold time
3
5
0
ns
tWLEF
Device enable controlled write pulse width
35
40
65
ns
tDVEF
Data setup time
35
40
50
ns
tEFDX
Data hold time
0
ns
tAVWH
Address valid to end of write
35
40
50
ns
tWHWL
1
Write disable time
5
ns
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