
The ST24/25x04 are 4 Kbit electrically erasable
programmable memories (EEPROM), organized
as 2 blocks of 256 x8 bits. They are manufactured
in STMicroelectronics’s Hi-Endurance Advanced
CMOS technology which guarantees an endur-
ance of one million erase/write cycles with a data
retention of 40 years.
Both Plastic Dual-in-Line and Plastic Small Outline
packages are available.
The memories are compatible with the I
2
C stand-
ard, two wire serial interface which uses a bi-direc-
tional data bus and serial clock. The memories
carry a built-in 4 bit, unique device identification
code (1010) corresponding to the I
2
C bus defini-
tion. This is used together with 2 chip enable inputs
(E2, E1) so that up to 4 x 4K devices may be
attached to the I
2
C bus and selected individually.
The memories behave as a slave device in the I
2
C
protocol with all memory operations synchronized
by the serial clock. Read and write operations are
initiated by a START condition generated by the
bus master. The START condition is followed by a
stream of 7 bits (identification code 1010), plus one
read/write bit and terminated by an acknowledge
bit.
SDA
VSS
SCL
MODE/WC
E1
E2
PRE
VCC
AI00852E
ST24x04
ST25x04
1
2
3
4
8
7
6
5
Figure 2A. DIP Pin Connections
1
2
3
4
AI01107E
8
7
6
5
SDA
VSS
SCL
MODE/WC
E1
E2
PRE
VCC
ST24x04
ST25x04
Figure 2B. SO Pin Connections
DESCRIPTION
(cont’d)
Symbol
Parameter
Value
Unit
T
A
Ambient Operating Temperature
–40 to 125
°
C
T
STG
Storage Temperature
–65 to 150
°
C
T
LEAD
Lead Temperature, Soldering
(SO8 package)
(PSDIP8 package)
40 sec
10 sec
215
260
°
C
V
IO
Input or Output Voltages
–0.6 to 6.5
V
V
CC
Supply Voltage
–0.3 to 6.5
V
V
ESD
Electrostatic Discharge Voltage (Human Body model)
(2)
4000
V
Electrostatic Discharge Voltage (Machine model)
(3)
500
V
Notes:
1. Except for the rating "Operating Temperature Range", stresses above those listed in the Table "Absolute Maximum Ratings"
may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other
conditions above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum
Rating conditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other
relevant quality documents.
2. MIL-STD-883C, 3015.7 (100pF, 1500
).
3. EIAJ IC-121 (Condition C) (200pF, 0
).
Table 2. Absolute Maximum Ratings
(1)
2/16
ST24/25C04, ST24/25W04