參數(shù)資料
型號(hào): XCV405E-6FG676I
廠商: XILINX INC
元件分類: FPGA
英文描述: Virtex-E 1.8 V Extended Memory Field Programmable Gate Arrays
中文描述: FPGA, 2400 CLBS, 129600 GATES, 357 MHz, PBGA676
封裝: PLASTIC, FBGA-676
文件頁數(shù): 8/20頁
文件大?。?/td> 191K
代理商: XCV405E-6FG676I
Virtex-E 1.8 V Extended Memory Field Programmable Gate Arrays
Module 3 of 4
DS025-3 (v2.3.2) March 14, 2003
16
1-800-255-7778
R
Virtex-E Pin-to-Pin Output Parameter Guidelines
All devices are 100% functionally tested. Listed below are representative values for typical pin locations and normal clock
loading. Values are expressed in nanoseconds unless otherwise noted.
Global Clock Input to Output Delay for LVTTL, 12 mA, Fast Slew Rate, with DLL
Global Clock Input to Output Delay for LVTTL, 12 mA, Fast Slew Rate, without DLL
Description(1)
Symbol
Device(3)
Speed Grade(2)
Units
Min
-8
-7
-6
LVTTL Global Clock Input to Output Delay using
Output Flip-flop, 12 mA, Fast Slew Rate, with
DLL.
For data output with different standards, adjust
the delays with the values shown in ‘‘IOB Output
TICKOFDLL
XCV405E
1.0
3.1
ns
XCV812E
1.0
3.1
ns
Notes:
1.
Listed above are representative values where one global clock input drives one vertical clock line in each accessible column, and
where all accessible IOB and CLB flip-flops are clocked by the global clock net.
2.
Output timing is measured at 50% VCC threshold with 35 pF external capacitive load. For other I/O standards and different loads, see
3.
DLL output jitter is already included in the timing calculation.
Description(1)
Symbol
Device
Speed Grade(2)
Units
Min
-8
-7
-6
LVTTL Global Clock Input to Output Delay using
Output Flip-flop, 12 mA, Fast Slew Rate, without
DLL.
For data output with different standards, adjust
the delays with the values shown in ‘‘IOB Output
TICKOF
XCV405E
1.6
4.5
4.7
4.9
ns
XCV812E
1.8
4.8
5.0
5.2
ns
Notes:
1.
Listed above are representative values where one global clock input drives one vertical clock line in each accessible column, and
where all accessible IOB and CLB flip-flops are clocked by the global clock net.
2.
Output timing is measured at 50% VCC threshold with 35 pF external capacitive load. For other I/O standards and different loads, see
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