
2-75
P
Speed Grade
-6
-5
-4
Description
Symbol
Device
Units
Global Clock to Output (fast)
T
ICKOF
XC4002A
XC4003A
XC4004A
XC4005A
XC4002A
XC4003A
XC4004A
XC4005A
XC4002A
XC4003A
XC4004A
XC4005A
XC4002A
XC4003A
XC4004A
XC4005A
XC4002A
XC4003A
XC4004A
XC4005A
XC4002A
XC4003A
XC4004A
XC4005A
14.9
15.1
15.3
15.5
19.9
20.1
20.3
20.5
2.6
2.4
2.2
2.0
4.9
5.1
5.3
5.5
21.8
21.5
21.2
21.0
0
0
0
0
12.2
12.5
12.8
13.0
15.2
15.5
15.8
16.0
2.3
2.0
1.7
1.5
3.7
4.0
4.3
4.5
18.8
18.5
18.2
18.0
0
0
0
0
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
11.6
(Max)
12.0
Global Clock to Output (slew limited)
T
ICKO
14.6
(Max)
15.0
Input Set-up Time, using IFF (no delay)
T
PSUF
1.6
(Min)
1.2
Input Hold time, using IFF (no delay)
T
PHF
4.0
(Min)
4.5
Input Set-up Time, using IFF (with delay)
T
PSU
12.0
(Min)
12.0
Input Hold Time, using IFF (with delay)
T
PH
(Min)
0
Guaranteed Input and Output Parameters (Pin-to-Pin)
All values listed below are tested directly. and guaranteed over the operating conditions. The same parameters can also be derived
indirectly from the IOB and Global Buffer specifications. The XACT delay calculator uses this indirect method. When there is a discrepancy
between these two methods, the directly tested values listed below should be used, and the derived values should be ignored.
IFF
Input
Set-Up
&
Hold
Time
OFF
Global Clock-to-Output Delay
X3192
T
PG
Timing is measured at pin threshold, with 50 pF external
capacitive loads (incl. test fixture). When testing fast out-
puts, only one output switches. When testing slew-rate
limited outputs, half the number of outputs on one side of the
device are switching. These parameter values are tested
and guaranteed for worst-case conditions of supply voltage
and temperature, and also with the most unfavorable clock
polarity choice.
PRELIMINARY
PRELIMINARY
See page 2-76
Pad to I1, I2
via transparent
latch, with delay
XC4003A 17.6 ns
T
PDLI
for -4 Speed Grade
Input set-up time
pad to clock (IK)
with delay
XC4003A 15.6 ns
T
PICKD
for -4 Speed Grade
X6091