X24640
11
ABSOLUTE MAXIMUM RATINGS*
Temperature under Bias
X24640.......................................–65
°
C to +135
°
C
Storage Temperature........................–65
°
C to +150
°
C
Voltage on any Pin with
Respect to V
SS
....................................–1V to +7V
D.C. Output Current..............................................5mA
Lead Temperature
(Soldering, 10 seconds) ..............................300
°
C
D.C. OPERATING CHARACTERISTICS
7038 FRM T06
CAPACITANCE
T
A
= +25
°
C, f = 1MHz, V
CC
= 5V
7038 FRM T07
Notes:
(1) Must perform a stop command prior to measurement.
(2) V
IL
min. and V
IH
max. are for reference only and are not 100% tested.
(3) This parameter is periodically sampled and not 100% tested.
Limits
Symbol
I
CC1
I
CC2
Parameter
Min.
Max.
1
Units
mA
Test Conditions
V
CC
Supply Current (Read)
V
CC
Supply Current (Write)
SCL = V
CC
X 0.1/V
CC
X 0.9 Levels
@ 400KHz, SDA = Open, All Other
Inputs =
V
SS
or V
CC
– 0.3V
SCL = SDA = V
CC
, All Other
Inputs =
V
SS
or V
CC
– 0.3V,
V
CC
= 5V
±
10%
SCL = SDA = V
CC
, All Other
Inputs =
V
SS
or V
CC
– 0.3V,
V
CC
= 2.5V
V
IN
=
V
SS
to V
CC
V
OUT
=
V
SS
to V
CC
3
mA
I
SB1(1)
V
CC
Standby Current
5
μ
A
I
SB2(1)
V
CC
Standby Current
1
μ
A
I
LI
I
LO
Input Leakage Current
10
μ
A
Output Leakage Current
10
μ
A
V
lL(2)
V
IH(2)
V
OL
V
hys(3)
Input LOW Voltage
–0.5
V
CC
x 0.3
V
Input HIGH Voltage
V
CC
x 0.7
V
CC
+ 0.5
V
Output LOW Voltage
0.4
V
I
OL
= 3mA
Hysteresis of Schmitt
Trigger Inputs
V
CC
x 0.05
V
Symbol
Parameter
Max.
8
Units
pF
Test Conditions
V
I/O
= 0V
C
I/O(3)
C
IN(3)
Input/Output Capacitance (SDA)
Input Capacitance (S
0
, S
1
, S
2
, SCL, WP)
6
pF
V
IN
= 0V
RECOMMENDED OPERATING CONDITIONS
7038 FRM T04
Temperature
Commercial
Industrial
Min.
0
°
C
–40
°
C
Max.
+70
°
C
+85
°
C
7038 FRM T05
Supply Voltage
X24640
X24640–2.5
X24640–1.8
Limits
4.5V to 5.5V
2.5V to 5.5V
1.8V to 3.6V
*COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
This is a stress rating only and the functional operation
of the device at these or any other conditions above
those indicated in the operational sections of this
specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may
affect device reliability.