參數(shù)資料
型號(hào): WS512K32V-XXX
英文描述: 512Kx32 SRAM 3.3V MULTICHIP PACKAGE
中文描述: 512Kx32 SRAM的3.3多芯片封裝
文件頁數(shù): 4/7頁
文件大?。?/td> 302K
代理商: WS512K32V-XXX
4
White Electronic Designs Corporation (602) 437-1520 www.wedc.com
White Electronic Designs
WS512K32V-XXX
March 2006
Rev. 12
Current Source
Current Source
I
OL
I
OH
C
eff
= 50 pf
D.U.T.
V
Z
1.5V
(Bipolar Supply)
AC CHARACTERISTICS
V
CC
= 3.3V, GND = 0V, -55°C
T
A
+125°C
Parameter
Write Cycle
Write Cycle Time
Chip Select to End of Write
Address Valid to End of Write
Data Valid to End of Write
Write Pulse Width
Address Setup Time
Address Hold Time
Output Active from End of Write
Write Enable to Output in High Z
Data Hold Time
1. This parameter is guaranteed by design but not tested.
Symbol
-15
-17
-20
Units
Min
15
12
12
9
12
0
0
2
Max
Min
17
12
12
9
14
0
0
3
Max
Min
20
14
14
10
14
0
0
3
Max
t
WC
t
CW
t
AW
t
DW
t
WP
t
AS
t
AH
t
OW
1
t
WHZ
1
t
DH
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
8
8
9
0
0
0
Parameter
Read Cycle
Read Cycle Time
Address Access Time
Output Hold from Address Change
Chip Select Access Time
Output Enable to Output Valid
Chip Select to Output in Low Z
Output Enable to Output in Low Z
Chip Disable to Output in High Z
Output Disable to Output in High Z
1. This parameter is guaranteed by design but not tested.
Symbol
-15
-17
-20
Units
Min
15
Max
Min
17
Max
Min
20
0
Max
t
RC
t
AA
t
OH
t
ACS
t
OE
t
CLZ
1
t
OLZ
1
t
CHZ
1
t
OHZ
1
ns
ns
ns
ns
ns
ns
ns
ns
ns
15
17
20
0
0
15
8
17
8
20
10
1
0
1
0
1
0
8
8
8
8
10
10
AC CHARACTERISTICS
V
CC
= 3.3V, GND = 0V, -55°C
T
A
+125°C
AC TEST CIRCUIT
Notes:
V
Z
is programmable from -2V to +7V.
I
OL
& I
OH
programmable from 0 to 16mA.
Tester Impedance Z
0
= 75
.
V
Z
is typically the midpoint of V
OH
and V
OL
.
I
OL
& I
OH
are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
AC Test Conditions
Parameter
Input Pulse Levels
Input Rise and Fall
Input and Output Reference Level
Output Timing Reference Level
Typ
Unit
V
ns
V
V
V
IL
= 0, V
IH
= 2.5
5
1.5
1.5
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