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參數(shù)資料
| 型號： | WF8M32-120G4DM5 |
| 英文描述： | 8Mx32 5V FLASH MODULE |
| 中文描述： | 8Mx32 5V的閃存模塊 |
| 文件頁數(shù)： | 4/10頁 |
| 文件大?。?/td> | 360K |
| 代理商： | WF8M32-120G4DM5 |
4
White Electronic Designs Corporation (602) 437-1520 www.wedc.com
White Electronic Designs
WF8M32-XG4DX5
October 1999
Rev. 3
ADVANCED
White Electronic Designs Corp. reserves the right to change products or specifications without notice.
FIGURE 3 – RESET TIMING DIAGRAM
AC CHARACTERISTICS – WRITE/ERASE/PROGRAM OPERATIONS – CS# CONTROLLED
V
CC
= 3.3V, V
SS
= 0V, -55°C ≤ T
A
≤ +125°C
Parameter
Symbol
-100
-120
-150
Unit
Min
100
0
50
0
50
0
50
20
Max
Min
120
0
50
0
50
0
50
20
Max
Min
150
0
50
0
50
0
50
20
Max
Write Cycle Time
Write Enable Setup Time
Chip Select Pulse Width
Address Setup Time
Data Setup Time
Data Hold Time
Address Hold Time
Chip Select Pulse Width High
Duration of Byte Programming Operation (1)
Sector Erase Time (2)
Read Recovery Time (2)
Chip Programming Time
Chip Erase Time (3)
Output Enable Hold Time (4)
t
AVAV
t
WLEL
t
ELEH
t
AVEL
t
DVEH
t
EHDX
t
ELAX
t
EHEL
t
WHWH1
t
WHWH2
t
GHEL
t
WC
t
WS
t
CP
t
AS
t
DS
t
DH
t
AH
t
CPH
ns
ns
ns
ns
ns
ns
ns
ns
μs
sec
μs
sec
sec
ns
300
15
300
15
300
15
0
0
0
100
480
100
480
100
480
t
OEH
10
10
10
NOTES:
1. Typical value for tWHWH1 is 7μs.
2. Typical value for tWHWH2 is 1sec.
3. Typical value for Chip Erase Time is 32sec.
4. For Toggle and Data Polling.
FIGURE 2 – AC TEST CIRCUIT
AC TEST CONDITIONS
Parameter
Input Pulse Levels
Input Rise and Fall
Input and Output Reference Level
Output Timing Reference Level
Typ
Unit
V
ns
V
V
V
IL
= 0, V
IH
= 3.0
5
1.5
1.5
NOTES:
V
Z
is programmable from -2V to +7V.
I
OL
& I
OH
programmable from 0 to 16mA.
Tester Impedance Z0 = 75 .
V
Z
is typically the midpoint of V
OH
and V
OL
.
I
OL
& I
OH
are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
I
Current Source
D.U.T.
C = 50 pf
I
OL
V
≈
1.5V
(Bipolar Supply)
Z
Current Source
OH
RESET#
t
RP
t
Ready
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