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參數(shù)資料
| 型號： | WEDPF2M64B-70BM3 |
| 廠商： | WHITE ELECTRONIC DESIGNS CORP |
| 元件分類： | PROM |
| 英文描述： | 2M X 64 FLASH 3.3V PROM MODULE, 70 ns, PBGA119 |
| 封裝： | STACKED TSOP, BGA-119 |
| 文件頁數(shù)： | 8/13頁 |
| 文件大?。?/td> | 317K |
| 代理商： | WEDPF2M64B-70BM3 |
4
White Electronic Designs Corporation (602) 437-1520 www.whiteedc.com
WEDPF2M64-XBX3
Parameter
Symbol
-70
-100
-120
-150
Unit
Min
Max Min Max Min Max Min Max
Write Cycle Time
t AVAV
tWC
70
100
120
150
ns
Write Enable Setup Time
tWLEL
tWS
0
ns
Chip Select Pulse Width
tELEH
tCP
35
45
50
ns
Address Setup Time
tAVEL
tAS
0
ns
Data Setup Time
tDVEH
tDS
45
50
ns
Data Hold Time
tEHDX
tDH
0
ns
Address Hold Time
t ELAX
tAH
45
50
ns
Chip Select Pulse Width High
tEHEL
tCPH
30
ns
Duration of Byte Programming Operation (1)
tWHWH1
300
s
Sector Erase Time
tWHWH2
15
sec
Read Recovery Time (2)
tGHEL
0
s
Chip Programming Time
50
sec
1. Typical value for tWHWH1 is 9s.
2. Guaranteed by design, but not tested.
AC CHARACTERISTICS WRITE/ERASE/PROGRAM OPERATIONS,CS CONTROLLED
(VCC = 3.3V, VSS = 0V, TA = -55°C to +125°C)
FIG 2: AC TEST CIRCUIT
AC TEST CONDITIONS
NOTES:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75W.
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to simulate a typical resistive
load circuit.
ATE tester includes jig capacitance.
Parameter
Typ
Unit
Input Pulse Levels
VIL = 0, VIH = 2.5
V
Input Rise and Fall
5
ns
Input and Output Reference Level
1.5
V
Output Timing Reference Level
1.5
V
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