參數(shù)資料
型號: W3E232M16S-250STC
廠商: MICROSEMI CORP-PMG MICROELECTRONICS
元件分類: DRAM
英文描述: 64M X 16 DDR DRAM, 0.7 ns, PDSO66
封裝: 0.400 X 0.875 INCH, 0.65 MM PITCH, TSOP2-66
文件頁數(shù): 17/22頁
文件大?。?/td> 0K
代理商: W3E232M16S-250STC
W3E232M16S-XSTX
4
White Electronic Designs Corporation (602) 437-1520 www.wedc.com
White Electronic Designs
December 2005
Rev. 1
White Electronic Designs Corp. reserves the right to change products or specications without notice.
PRELIMINARY*
bandwidth by hiding row precharge and activation time.
An auto refresh mode is provided, along with a power-
saving power-down mode. All inputs are compatible with
the Jedec Standard for SSTL_2. All full drive options
outputs are SSTL_2, Class II compatible.
FUNCTIONAL DESCRIPTION
Read and write accesses to the DDR SDRAM are burst
oriented; accesses start at a selected location and continue
for a programmed number of locations in a programmed
sequence. Accesses begin with the registration of an
ACTIVE command which is then followed by a READ or
WRITE command. The address bits registered coincident
with the ACTIVE command are used to select the bank and
row to be accessed (BA0 and BA1 select the bank, A0-12
select the row). The address bits registered coincident
with the READ or WRITE command are used to select the
starting column location for the burst access.
Prior to normal operation, the DDR SDRAM must be
initialized. The following sections provide detailed
information covering device initialization, register denition,
command descriptions and device operation.
INITIALIZATION
DDR SDRAMs must be powered up and initialized in a
predened manner. Operational procedures other than
those specied may result in undened operation. Power
must rst be applied to VCC and VCCQ simultaneously, and
then to VREF (and to the system VTT). VTT must be applied
after VCCQ to avoid device latch-up, which may cause
permanent damage to the device. VREF can be applied any
time after VCCQ but is expected to be nominally coincident
with VTT. Except for CKE, inputs are not recognized as
valid until after VREF is applied. CKE is an SSTL_2 input
but will detect an LVCMOS LOW level after VCC is applied.
After CKE passes through VIH, it will transition to an
SSTL_2 signal and remain as such until power is cycled.
Maintaining an LVCMOS LOW level on CKE during power-
up is required to ensure that the DQ and DQS outputs will
be in the High-Z state, where they will remain until driven
in normal operation (by a read access). After all power
supply and reference voltages are stable, and the clock
is stable, the DDR SDRAM requires a 200s delay prior
to applying an executable command.
Once the 200s delay has been satised, a DESELECT
or NOP command should be applied, and CKE should
GENERAL DESCRIPTION
The 2x32Mx16 (1Gb) DDR SDRAM is a high-speed CMOS,
dynamic random-access, memory using 2 chips containing
536,870,912 bits. Each chip is internally configured as a
quad-bank DRAM.
The 2x32Mx16 DDR SDRAM uses a double data rate
architecture to achieve high-speed operation. The
double data rate architecture is essentially a 2n-prefetch
architecture with an interface designed to transfer two data
words per clock cycle at the I/O pins. A single read or write
access for the 2x32Mx16 DDR SDRAM effectively consists
of a single 2n-bit wide, one-clock-cycle data tansfer at the
internal DRAM core and two corresponding n-bit wide,
one-half-clock-cycle data transfers at the I/O pins.
A bi-directional data strobe (DQS) is transmitted externally,
along with data, for use in data capture at the receiver.
strobe transmitted by the DDR SDRAM during READs and
by the memory contoller during WRITEs. DQS is edge-
aligned with data for READs and center-aligned with data
for WRITEs. Each chip has two data strobes, one for the
lower byte and one for the upper byte.
The 2x32Mx16 DDR SDRAM operates from a differential
clock (CK and CK#); the crossing of CK going HIGH and
CK# going LOW will be referred to as the positive edge of
CK. Commands (address and control signals) are registered
at every positive edge of CK. Input data is registered on
both edges of DQS, and output data is referenced to both
edges of DQS, as well as to both edges of CK.Read and
write accesses to the DDR SDRAM are burst oriented;
accesses start at a selected location and continue for
a programmed number of locations in a programmed
sequence. Accesses begin with the registration of an
ACTIVE command, which is then followed by a READ or
WRITE command. The address bits registered coincident
with the ACTIVE command are used to select the bank
and row to be accessed. The address bits registered
coincident with the READ or WRITE command are used
to select the bank and the starting column location for the
burst access.
The DDR SDRAM provides for programmable READ
or WRITE burst lengths of 2, 4, or 8 locations. An auto
precharge function may be enabled to provide a self-
timed row precharge that is initiated at the end of the
burst access.
The pipelined, multibank architecture of DDR SDRAMs allows
for concurrent operation, thereby providing high effective
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