
16
V53C819H Rev. 1.0 February 1999
MOSEL V ITELIC
V53C819H
Extended Data Output Page Mode
EDO Page operation permits all 512 columns
within a selected row of the device to be randomly
accessed at a high data rate. Maintaining RAS low
while performing successive CAS cycles retains the
row address internally and eliminates the need to
reapply it for each cycle. The column address buffer
acts as a transparent or flow-through latch while
CAS is high. Thus, access begins from the
occurrence of a valid column address rather than
from the falling edge of CAS, eliminating t
ASC
and t
T
from the critical timing path. CAS latches the
address into the column address buffer. During
EDO operation, Read, Write, Read-Modify-Write or
Read-Write-Read cycles are possible at random
addresses within a row. Following the initial entry
cycle into Hyper Page Mode, access is t
CAA
or t
CAP
controlled. If the column address is valid prior to the
rising edge of CAS, the access time is referenced to
the CAS rising edge and is specified by t
CAP
. If the
column address is valid after the rising CAS edge,
access is timed from the occurrence of a valid
address and is specified by t
CAA
. In both cases, the
falling edge of CAS latches the address and
enables the output.
EDO provides a sustained data rate of 83 MHz for
applications that require high bandwidth such as bit-
mapped graphics or high-speed signal processing.
The following equation can be used to calculate the
maximum data rate:
Data Output Operation
The V53C819H Input/Output is controlled by OE,
CAS, WE and RAS. A RAS low transition enables
the transfer of data to and from the selected row
address in the Memory Array. A RAS high transition
disables data transfer and latches the output data if
the output is enabled. After a memory cycle is
initiated with a RAS low transition, a CAS low
transition or CAS low level enables the internal I/O
path. A CAS high transition or a CAS high level
disables the I/O path and the output driver if it is
enabled. A CAS low transition while RAS is high has
no effect on the I/O data path or on the output
drivers. The output drivers, when otherwise
enabled, can be disabled by holding OE high. The
OE signal has no effect on any data stored in the
output latches. A WE low level can also disable the
output drivers when CAS is low. During a Write
cycle, if WE goes low at a time in relationship to
CAS that would normally cause the outputs to be
active, it is necessary to use OE to disable the
output drivers prior to the WE low transition to allow
Data In Setup Time (t
DS
) to be satisfied.
Power-On
After application of the V
CC
supply, an initial
pause of 200
μ
s is required followed by a minimum
of 8 initialization cycles (any combination of cycles
containing a RAS clock). Eight initialization cycles
are required after extended periods of bias without
clocks (greater than the Refresh Interval).
During Power-On, the V
CC
current requirement of
the V53C819H is dependent on the input levels of
RAS and CAS. If RAS is low during Power-On, the
device will go into an active cycle and I
CC
will exhibit
current transients. It is recommended that RAS and
CAS track with V
CC
or be held at a valid V
IH
during
Power-On to avoid current surges.
Table 1. V53C819H Data Output
Operation for Various Cycle Types
Data Rate
511
t
RC
t
PC
×
+
----------------------------------------
=
Cycle Type
I/O State
Read Cycles
Data from Addressed
Memory Cell
CAS-Controlled Write
Cycle (Early Write)
High-Z
WE-Controlled Write
Cycle (Late Write)
OE Controlled. High
OE = High-Z I/Os
Read-Modify-Write
Cycles
Data from Addressed
Memory Cell
EDO Read Cycle
Data from Addressed
Memory Cell
EDO Write Cycle
(Early Write)
High-Z
EDO Read-Modify-
Write Cycle
Data from Addressed
Memory Cell
RAS-only Refresh
High-Z
CAS-before-RAS
Refresh Cycle
Data remains as in
previous cycle
CAS-only Cycles
High-Z