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參數(shù)資料
| 型號(hào)： | USB1101 |
| 廠商： | Fairchild Semiconductor Corporation |
| 英文描述： | USB 2.0 FS Peripheral Transceiver |
| 中文描述： | 財(cái)政司司長(zhǎng)外設(shè)的USB 2.0收發(fā)器 |
| 文件頁(yè)數(shù)： | 4/10頁(yè) |
| 文件大?。?/td> | 445K |
| 代理商： | USB1101 |
Preliminary
www.fairchildsemi.com
4
U
Absolute Maximum Ratings
(Note 7)
System ESD Testing
Recommended Operating Conditions
Note 7:
The Absolute Maximum Ratings are those values beyond which the safety of the device cannot be guaranteed. The device should not be operated
at these limits. The parametric values defined in the Electrical Characteristics table are not guaranteed at the Absolute Maximu
m Ratings. The
“
Recom-
mended Operating Conditions
”
table will define the conditions for actual device operation.
Note 8:
HBM: Mil-Std_883E compliance. Socketed testing of three units per zap voltage (3 pulses and 3 pulses). I
O
v I
O
, I
O
v GND, I
O
v V
CC
, V
CC
v GND.
Note 9:
MM: ESD_STM 5.2 compliance. Socketed testing of three units per zap voltage (3 pulses and 3 pulses). I
O
v I
O
, I
O
v GND, I
O
v V
CC
, V
CC
v GND.
Note 10:
CDM: ESD_STM 5.3.1 compliance. Devices (3 per level) are charged, entire package, and discharged through a single pin contacted to each indi-
vidual pin on the DUT. NC pins are not stressed. Positive and negative charge is placed on the DUT (sitting atop a metallic plate). Maximum stress voltage
applicable at FSME is 2000V.
Note 11:
This test is an extension of HBM Mil_Std 883E. However, this test is confined to the differential pins only.
Note 12:
IEC61000-4-2 system level testing: System level testing done on this parts evaluation system boar.
Symbol
Parameter
Conditions
Limits
Units
Min
0.5
0.5
Max
4.6
4.6
18.0
V
CC
V
CCIO
I
IK
V
I
I
OK
V
O
I
O
Supply Voltage
I/O Supply Voltage
DC Input Current
DC Input Voltage
DC Output Diode Current
DC Output Voltage
DC Output Source or Sink
Current for D , D Pins
SE0_VM/DAT_VP
DC V
CC
or GND Current
ESD Immunity Voltage
HBM (Mil-std. 883E)
MM (ESD_STM 5.2)
V
V
V
I
0
(Note 8)
V
O
!
V
CC
or 0
(Note 8)
V
O
0 to V
CC
mA
V
mA
V
0.5
V
CCIO
0.5
r
18.0
V
CCIO
0.5
0.5
mA
r
12.0
r
12.0
r
100
TBD
I
CC
, I
GND
V
ESD
mA
V
I
O
, GND, V
CC
Pins (Note 8)
V
CCIO
0.5
Pins (Note 9)
I
O
, GND, V
CC
Pins (Note 10)
Pins D , D (Note 11)
USB Connector
2000
200
TBD
V
CDM (ESD_STM 5.3.1)
1000
2000
V
HBM (Mil-std. 883E)
TBD
TBD
40.0
TBD
TBD
125
60.0
V
V
q
C
mW
T
STO
P
TOT
Storage Temperature Range
Power Dissipation
I
CC
System
Parameter
Conditions
Limits
Units
Min
TBD
Max
TBD
ESDsys
IEC61000-4-2 (Note 12)
USB Connector
V
Symbol
Parameter
Conditions
Limits
Units
Min
3.0
1.65
0
0
40.0
Max
3.6
3.6
3.6
3.6
85.0
V
CC
V
CCIO
V
I
V
AI/O
T
AMB
DC Supply Voltage
I/O DC Voltage
DC Input Voltage Range
DC Input Range for AI/O
Operating Ambient Temperature
V
V
V
V
q
C
Pins D and D
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