參數(shù)資料
型號(hào)： UPD44325362F5-E40-EQ2
廠商： NEC Corp.
英文描述： 36M-BIT QDRII SRAM 2-WORD BURST OPERATION
中文描述： 36M條位推出QDRII SRAM的2字爆發(fā)運(yùn)作
文件頁(yè)數(shù)： 25/32頁(yè)
文件大?。?/td> 357K
代理商： UPD44325362F5-E40-EQ2
25
Preliminary Data Sheet
M16783EJ1V0DS
μ
PD44325082, 44325092, 44325182, 44325362
TAP Controller State Diagram
Test-Logic-Reset
Run-Test / Idle
Select-DR-Scan
Capture-DR
Capture-IR
Shift-DR
Exit1-DR
Pause-DR
Exit2-DR
Update-DR
Update-IR
Exit2-IR
Pause-IR
Exit1-IR
Shift-IR
Select-IR-Scan
0
0
0
1
0
1
1
0
0
1
0
1
1
0
0
0
0
1
0
1
0
1
1
1
0
1
1
0
1
0
1
1
Disabling the Test Access Port
It is possible to use this device without utilizing the TAP. To disable the TAP Controller without interfering with normal
operation of the device, TCK must be tied to V
SS
to preclude mid level inputs.
TDI and TMS are designed so an undriven input will produce a response identical to the application of a logic 1, and
may be left unconnected. But they may also be tied to V
DD
through a 1 k
resistor.
TDO should be left unconnected.
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