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參數(shù)資料
| 型號： | TPM754A |
| 廠商： | NXP Semiconductors N.V. |
| 英文描述： | Microcontroller with TrackPoint microcode from IBM(IBM的帶有磁道點微碼的微控制器) |
| 中文描述： | 微控制器，帶有軌跡球來自IBM的微碼（IBM公司的帶有磁道點微碼的微控制器） |
| 文件頁數(shù)： | 6/12頁 |
| 文件大小： | 81K |
| 代理商： | TPM754A |
Philips Semiconductors
Preliminary specification
TPM754A
Microcontroller with TrackPoint
microcode from IBM
1999 Nov 11
6
ABSOLUTE MAXIMUM RATINGS
1, 3, 4
PARAMETER
RATING
UNIT
°
C
V
Storage temperature range
–65 to +150
Voltage from V
CC
to V
SS
Voltage from any pin to V
SS
Power dissipation
–0.5 to +6.5
–0.5 to V
CC
+ 0.5
1.0
V
W
DC ELECTRICAL CHARACTERISTICS
T
amb
= 0
°
C to +70
°
C, AV
CC
= 5 V
±
5, AV
SS
= 0 V
4
V
CC
= 5 V
±
10%, V
SS
= 0 V
SYMBOL
PARAMETER
TEST CONDITIONS
LIMITS
4
TYP
1
UNIT
MIN
MAX
I
CC
Inputs
V
IL
V
IH
V
IH1
Outputs
V
OL
V
OL1
V
OH
I
LI
C
IO
Supply current (see Figure 5)
Input low voltage, port 1, 3
–0.5
0.2V
CC
–0.1
V
CC
+0.5
V
CC
+0.5
V
Input high voltage, port 1, 3
Input high voltage, X1, RST
0.2V
CC
+0.9
0.7V
CC
V
V
Output low voltage, port 3, 1.2
Output low voltage, port 1.0, 1.1
Output high voltage, ports 3, 1.0, 1.1
Input leakage current, port 1, 3, RST
Pin capacitance
I
OL
= 1.6 mA
2
I
OL
= 3.2 mA
2
I
OH
= –60
μ
A,
0.45 < V
IN
< V
CC
Test freq = 1 MHz,
T
amb
= 25
°
C
0.45
0.45
V
V
V
μ
A
pF
2.4
±
10
10
NOTES:
1. Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any conditions other than those described in the AC and DC Electrical Characteristics section
of this specification is not implied.
2. Under steady state (non-transient) conditions, IOL must be externally limited as follows:
Maximum I
OL
per port pin:
10mA
Maximum I
per 8-bit port:
26mA
Maximum total I
for all outputs:
67mA
If I
OL
exceeds the test condition, V
OL
may exceed the related specification. Pins are not guaranteed to sink current greater than the listed
test conditions.
3. This product includes circuitry specifically designed for the protection of its internal devices from the damaging effects of excessive static
charge. Nonetheless, it is suggested that conventional precautions be taken to avoid applying greater than the rated maxima.
4. Parameters are valid over operating temperature range unless otherwise specified. All voltages are with respect to V
SS
unless otherwise
noted.
5. Power-down I
CC
is measured with all output pins disconnected; X2, X1 n.c.; RST = V
SS
.
6. I
CC
is measured with all output pins disconnected; X1 driven with t
CLCH
, t
CHCL
= 5 ns, V
IL
= V
SS
+ 0.5 V, V
IH
= V
CC
– 0.5 V; X2 n.c.;
RST = V
CC
. I
CC
will be slightly higher if a crystal oscillator is used.
7. Idle I
CC
is measured with all output pins disconnected; X1 driven with t
CLCH
, t
CHCL
= 5 ns, V
IL
= V
SS
+ 0.5 V, V
IH
= V
CC
– 0.5 V; X2 n.c.;
RST = V
SS
.
8. Pin 9, 10, 11, and 21; V
IN
≤
V
REG
.
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