
TLC2942
HIGH-PERFORMANCE DUAL PHASE-LOCKED LOOP BUILDING BLOCK
SLAS146B – NOVEMBER 1996 – REVISED JUNE 1997
10
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
VCO1, VCO2 electrical characteristics, VDD = 5 V, TA = 25°C (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VOH
High-level output voltage
IOH = – 2 mA
4
V
VOL
Low-level output voltage
IOL = 2 mA
0.5
V
VIT
Input threshold voltage
SELECT1, SELECT2,
VCOINHIBIT1, VCOINHIBIT2
1.5
2.5
3.5
V
II
Input current
SELECT1, SELECT2,
VCOINHIBIT1, VCOINHIBIT2
VI = VDD or GND
±1
A
Zi(VCOIN)
Input impedance
VCOIN1, VCOIN2
VCOIN = 1/2 VDD
10
M
IDD(INH)
VCO supply current (inhibit) (each chip)
See Note 4
0.01
1
A
IDD(VCO)
VCO supply current (each chip)
See Note 10
15
35
mA
NOTES: 4.
The current into VCO VDD and LOGIC VDD when VCOINHIBIT = VDD, and the PFD is inhibited.
10. The current into VCO VDD and LOGIC VDD when VCOIN = 1/2 VDD, RBIAS = 2.2 k, VCOINHIBIT = GND, and the PFD is inhibited.
PFD1, PFD2 electrical characteristics, VDD = 5 V, TA = 25°C (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VOH
High-level output voltage
IOH = 2 mA
4.5
V
VOL
Low-level output voltage
IOL = 2 mA
0.2
V
IOZ
High-impedance output current
PFD INHIBIT1, PFD INHIBIT2 = high,
VO = VDD or GND
±1
A
VIH
High-level input voltage
FIN–A1, FIN–B1,
FIN–A2, FIN–B2
4.5
V
VIL
Low-level input voltage
FIN–A1, FIN–B1,
FIN–A2, FIN–B2
1
V
VIT
Input threshold voltage
PFD INHIBIT2,
PFD INHIBIT1
1.5
2.5
3.5
V
Ci
Input capacitance
FIN–A1, FIN–B1,
FIN–A2, FIN–B2
5
pF
Zi
Input impedance
FIN–A1, FIN–B1,
FIN–A2, FIN–B2
10
M
IDD(Z)
High-impedance state PFD supply current
See Note 6
0.1
1
A
IDD(PFD)
PFD supply current (each chip)
See Note 11
0.15
3
mA
NOTES:
6. The current into LOGIC VDD, when FIN–A and FIN–B = GND, PFD INHIBIT= VDD, no load, and VCO OUT is inhibited.
11. The current into LOGIC VDD when FIN–A and FIN–B = 1 MHz with VI(PP) = 5-V rectangular wave, PFD INHIBIT = GND, no load,
and
VCO OUT is inhibited.