參數(shù)資料
型號(hào): TLC2810Z
廠商: Texas Instruments, Inc.
英文描述: LinCMOS Precision Dual Operational Amplifier(雙路低噪聲,單電源運(yùn)放)
中文描述: LinCMOS精密雙運(yùn)算放大器(雙路低噪聲,單電源運(yùn)放)
文件頁(yè)數(shù): 18/23頁(yè)
文件大?。?/td> 503K
代理商: TLC2810Z
TLC2810Z, TLC2810Y
LinCMOS
PRECISION
DUAL OPERATIONAL AMPLIFIERS
SLOS120A – AUGUST 1993 – REVISED AUGUST 1994
2–18
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
POST OFFICE BOX 1443
HOUSTON, TEXAS 77251–1443
PARAMETER MEASUREMENT INFORMATION
full-power response (continued)
input signal until the maximum frequency above which the output contains significant distortion is found. The
full-peak response is defined as the maximum output frequency, without regard to distortion, above which full
peak-to-peak output swing cannot be maintained.
Because there is no industry-wide accepted value for significant distortion, the full-peak response is specified
in this data sheet and is measured using the circuit of Figure 26. The initial setup involves the use of a sinusoidal
input to determine the maximum peak-to-peak output of the device (the amplitude of the sinusoidal wave is
increased until clipping occurs). The sinusoidal wave is then replaced with a square wave of the same amplitude.
The frequency is then increased until the maximum peak-to-peak output can no longer be maintained
(Figure 30). A square wave is used to allow a more accurate determination of the point at which the maximum
peak-to-peak output is reached.
(d) f > BOM
(c) f = BOM
(b) BOM > f > 100 Hz
(a) f = 100 Hz
Figure 30. Full-Power-Response Output Signal
test time
Inadequate test time is a frequent problem, especially when testing CMOS devices in a high-volume,
short-test-time environment. Internal capacitances are inherently higher in CMOS than in bipolar and BiFET
devices; hence, CMOS devices require longer test times than their bipolar and BiFET counterparts. The problem
becomes more pronounced with reduced power supply levels and lower temperatures.
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