
VO = 0.4 V
IOZL
VCC = 5.25 V,
μ
A
VO = 2.7 V
IOZH
VCC = 5.25 V,
μ
A
TIBPAL20L8-10C, TIBPAL20R4-10C, TIBPAL20R6-10C, TIBPAL20R8-10C
HIGH-PERFORMANCE
IMPACT-X
PAL
CIRCUITS
SRPS008A – D3336, OCTOBER 1989 – REVISED MARCH 1992
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
10
electrical characteristics over recommended operating free-air temperature range
PARAMETER
TEST CONDITIONS
II = –18 mA
IOH = –3.2 mA
IOL = 24 mA
MIN
TYP
–0.8
MAX
–1.5
UNIT
V
V
V
VIK
VOH
VOL
VCC = 4.75 V,
VCC = 4.75 V,
VCC = 4.75 V,
2.4
0.3
0.5
O, Q outputs
20
I/O ports
O, Q outputs
I/O ports
100
–20
–100
0.2
II
IIH
IIL
IOS§
VCC = 5.25 V,
VCC = 5.25 V,
VCC = 5.25 V,
VCC = 5.25 V,
VCC = 5.25 V,
Outputs open,
f = 1 MHz,
f = 1 MHz,
f = 1 MHz,
VI = 5.5 V
VI = 2.7 V
VI = 0.4 V
VO = 0.5 V
VI = 0,
OE = VIH
VI = 2 V
VO = 2 V
VCLK = 2 V
mA
μ
A
mA
25
–0.25
–30
–70
–130
mA
ICC
210
mA
Ci
Co
Cclk
7
8
pF
pF
pF
12
switching characteristics
over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted)
PARAMETER
FROM
(INPUT)
TO
(OUTPUT)
TEST CONDITION
MIN
TYP
MAX
UNIT
without feedback
with internal feedback
(counter configuration)
with external feedback
71.4
fmax
58.8
MHz
55.5
tpd
tpd
tpd#
ten
tdis
ten
tdis
tsk(o)||
I, I/O
CLK
↑
O, I/O
Q
R1 = 200
,
R2 = 390
,
3
2
8
5
10
8
ns
CLK
↑
OE
↓
OE
↑
I, I/O
I, I/O
Feedback input
See Figure 6
7
ns
Q
Q
2
2
3
2
6
6
8
8
10
10
10
10
ns
ns
ns
ns
O, I/O
O, I/O
Skew between registered outputs
0.5
ns
All typical values are at VCC = 5 V, TA = 25
°
C.
I/O leakage is the worst case of IOZL and IIL or IOZH and IIH respectively.
§Not more than one output should be shorted at a time, and the duration of the short circuit should not exceed one second. VO is set at 0.5 V to
avoid test problems caused by test equipment ground degradation.
See section for fmax specifications. fmax does not apply for TIBPAL20L8’.
#This parameter applies to TIBPAL20R4’ and TIBPAL20R6’ only (see Figure 4 for illustration) and is calculated from the measured fmax with internal
feedback in the counter configuration.
||This parameter is the measurement of the difference between the fastest and slowest tpd (CLK-to-Q) observed when multiple registered outputs
are switching in the same direction.