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參數(shù)資料
| 型號(hào)： | TDA8260 |
| 廠商： | NXP Semiconductors N.V. |
| 英文描述： | Satellite Zero-IF QPSK/8PSK downconverter with PLL synthesizer |
| 中文描述： | 衛(wèi)星零中頻QPSK/8PSK與PLL合成器變頻器 |
| 文件頁(yè)數(shù)： | 15/23頁(yè) |
| 文件大?。?/td> | 143K |
| 代理商： | TDA8260 |
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2004 Sep 03
15
Philips Semiconductors
Product specification
Satellite Zero-IF QPSK/8PSK
downconverter with PLL synthesizer
TDA8260TW
Table 9
Test signal conditions for pulling measurements
The level of the wanted and unwanted signals given in Table 9 are measured at the outputs of the RF signal generators.
The sensitivity to pulling is measured in baseband by the difference expressed in dB (
) between the level of the wanted
signal and the spurious signal that has been generated by pulling. The ANZAC reference is HH128.
TEST
SIGNAL
FREQUENCY
LEVEL
CONTENT
(see Fig.9)
3/4LO test
wanted
unwanted
local oscillator
wanted
unwanted
local oscillator
f
w
= 2161 MHz
f
uw
= 1613 MHz
f
LO
= 2150 MHz
f
w
= 1761 MHz
f
uw
= 2188 MHz
f
LO
= 1750 MHz
10 dBm
2 dBm
10 dBm
2 dBm
f
w
= f
LO
+ 11 MHz
f
uw
= f
LO
×
3
/
4
+ 500 kHz
f
w
= f
LO
+ 11 MHz
f
uw
= f
LO
×
5
/
4
+ 500 kHz
5/4LO test
handbook, halfpage
MGU794
11
wanted
signal
11.5
spurious
signal
f (MHz)
Vsignal
Fig.9 Baseband spectrum.
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